Photonic semiconductor device and method of manufacture
View Patent ↗A package includes an interposer structure including a first via; a first interconnect device including conductive routing and which is free of active devices; an encapsulant surrounding the first via and the first interconnect device; and a first interconnect structure over the encapsulant and connected to the first via and the first interconnect device; a first semiconductor die bonded to the first interconnect structure and electrically connected to the first interconnect device; and a first photonic package bonded to the first interconnect structure and electrically connected to the first semiconductor die through the first interconnect device, wherein the first photonic package includes a photonic routing structure including a waveguide on a substrate; a second interconnect structure over the photonic routing structure, the second interconnect structure including conductive features and dielectric layers; and an electronic die bonded to and electrically connected to the second interconnect structure.
1. A method, comprising:
forming a photonic package, wherein forming the photonic package comprises:
patterning a silicon layer to form a waveguide;
forming a first interconnect structure over the waveguide; and
bonding a first semiconductor die to the first interconnect structure;
forming an interconnect device, wherein the interconnect device is free of active devices, wherein forming the interconnect device comprises:
forming a routing structure on a first side of a substrate; and
forming conductive connectors on and electrically connected to the routing structure;
forming an interposer structure, wherein forming the interposer structure comprises:
forming a first via on a first carrier;
placing the interconnect device on the first carrier;
encapsulating the first via and the interconnect device with an encapsulant; and
forming a second interconnect structure on the interconnect device and the first via, wherein the second interconnect structure is electrically connected to the first via and to the conductive connectors of the interconnect device; and
bonding the photonic package and a second semiconductor die to the second interconnect structure, wherein the photonic package and the second semiconductor die are electrically connected through the interconnect device to each other.
2. The method of claim 1 further comprising bonding a memory die to the second interconnect structure.
3. The method of claim 1 wherein forming the photonic package further comprises forming a photodetector that is optically coupled to the waveguide, wherein the photodetector is electrically connected to the interconnect structure.
4. The method of claim 1 wherein forming the photonic package further comprises patterning the silicon layer to form a grating coupler.
5. The method of claim 4 further comprising attaching an optical fiber to the photonic package over the interconnect structure of the photonic package, wherein the optical fiber is optically coupled to the grating coupler.
6. The method of claim 1 , wherein forming the photonic package further comprises patterning the silicon layer to form an edge coupler.
7. The method of claim 1 further comprising forming a third interconnect structure on a second side of the substrate of the interconnect device, wherein the second side is opposite the first side, and wherein the third interconnect structure is electrically connected to the interconnect device and the first via.
8. The method of claim 1 , wherein forming the interconnect device further comprises forming through vias extending through the substrate.
9. The method of claim 1 , wherein bonding the first semiconductor die to the first interconnect structure comprises a dielectric-to-dielectric bonding process.
10. A method comprising:
forming a plurality of vias on a first carrier;
placing a plurality of interconnect devices on the first carrier, wherein each interconnect device is free of active devices, and wherein each interconnect device comprises a first interconnect structure on a substrate and through-substrate vias (TSVs) extending through the substrate;
encapsulating the plurality of vias and the plurality of interconnect devices with an encapsulant;
forming a second interconnect structure over a first side of the plurality of vias, the plurality of interconnect devices, and the encapsulant, wherein the second interconnect structure is electrically connected to the plurality of vias and to respective first interconnect structures of the plurality of interconnect devices;
forming a plurality of conductive connectors on the second interconnect structure, wherein the conductive connectors are connected to the second interconnect structure;
bonding a first semiconductor die to first conductive connectors of the plurality of conductive connectors, wherein the first semiconductor die is electrically connected to a first interconnect device of the plurality of interconnect devices; and
bonding a photonic package to second conductive connectors of the plurality of conductive connectors, wherein the photonic package is electrically connected to the first interconnect device of the plurality of interconnect devices, and wherein the photonic package comprises a waveguide, a photodetector optically coupled to the waveguide, and a second semiconductor die electrically connected to the photodetector.
11. The method of claim 10 further comprising mounting an optical fiber to a sidewall of the photonic package, wherein the optical fiber is optically coupled to the waveguide.
12. The method of claim 10 further comprising mounting an optical fiber to a top surface of the photonic package, wherein the optical fiber is optically coupled to the waveguide.
13. The method of claim 10 further comprising encapsulating the first semiconductor die with a molding material.
14. The method of claim 10 further comprising pacing an integrated passive device on the first carrier.
15. The method of claim 10 further comprising forming a first underfill material under the photonic package and a second underfill material under the first semiconductor die.
16. A method comprising:
forming a first interconnect structure comprising:
forming a plurality of vias on a first redistribution structure;
forming a plurality of interconnect devices on the first interconnect structure, wherein the interconnect devices are free of active devices, wherein each interconnect device respectively comprises a plurality of through-vias in a substrate;
encapsulating the plurality of vias and the plurality of interconnect devices; and
forming a second redistribution structure on the plurality of vias and on the plurality of interconnect devices, wherein the second redistribution structure is electrically coupled to the first redistribution structure;
connecting a photonic device to the second redistribution structure, wherein the photonic device comprises a waveguide; and
connecting a first semiconductor device to the second redistribution structure adjacent the photonic device.
17. The method of claim 16 , wherein the photonic device further comprises a second semiconductor device.
18. The method of claim 16 , wherein each interconnect device respectively further comprises a routing structure.
19. The method of claim 16 , wherein a first interconnect device of the plurality of interconnect devices is electrically coupled to the photonic device and the first semiconductor device.
20. The method of claim 16 further comprising attaching an optical fiber to the photonic device, wherein the photonic device is optically coupled to the waveguide.