Inspection apparatus and inspection method
An inspection apparatus for inspecting an inspection target object, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection target object, and a plurality of X-ray detectors, wherein each of the plurality of X-ray detectors detects X-rays emitted from a foreign substance existing on an inspection target surface of the inspection target object irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface.
1. An inspection apparatus for inspecting an inspection target object, comprising:
an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection target object; and
a plurality of X-ray detectors,
wherein each of the plurality of X-ray detectors detects X-rays emitted from a foreign substance existing on an inspection target surface of the inspection target object irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface,
wherein a distance between an inspection plane of the inspection target object and the X-ray generation portion is not larger than 5 mm.
2. The inspection apparatus according to claim 1 , further comprising a processor configured to perform processing of detecting the foreign substance based on an output from the X-ray detector.
3. The inspection apparatus according to claim 2 , wherein the processor further performs processing of specifying a material forming the foreign substance.
4. The inspection apparatus according to claim 1 , wherein the distance is not larger than 3 mm.
5. The inspection apparatus according to claim 1 , wherein an angle formed by the inspection plane and a virtual line connecting a center of an X-ray receiving portion of one of the plurality of X-ray detectors and an intersection point of the inspection plane and an axis of the X-ray generation tube is not larger than 5°.
6. The inspection apparatus according to claim 5 , wherein the angle is not larger than 2°.
7. The inspection apparatus according to claim 5 , further comprising a slit member having a slit on the virtual line.
8. The inspection apparatus according to claim 1 , further comprising an X-ray detection panel configured to detect X-rays emitted from the X-ray generation portion and transmitted through an inspection target object having the inspection target surface.
9. The inspection apparatus according to claim 1 , wherein the X-ray generation tube is of a sealed transmission type.
10. The inspection apparatus according to claim 1 , wherein the X-ray generation tube includes a target holding plate configured to hold the target, and a thickness of the target holding plate is not larger than 4 mm.
11. The inspection apparatus according to claim 10 , wherein the target holding plate contains diamond.
12. The inspection apparatus according to claim 1 , wherein the plurality of X-ray detectors include a first X-ray detector and a second X-ray detector, and the first X-ray detector and the second X-ray detector are arranged to face each other via the axis of the X-ray generation tube.
13. The inspection apparatus according to claim 1 , wherein
the plurality of X-ray detectors include a first X-ray detector including a first X-ray receiving portion and a second X-ray detector including a second X-ray receiving portion, and
an angle formed by the inspection plane and a virtual line connecting a center of the first X-ray receiving portion and the intersection point of the inspection plane and an axis of the X-ray generation tube is different from an angle formed by the inspection plane and a virtual line connecting a center of the second X-ray receiving portion and the intersection point.
14. The inspection apparatus according to claim 1 , wherein
the plurality of X-ray detectors include a first X-ray detector and a second X-ray detector, and
a position of the first X-ray detector and the second X-ray detector are different from each other in a direction parallel to the inspection plane.
15. The inspection apparatus according to claim 1 , wherein
the plurality of X-ray detectors include a first X-ray detector configured to inspect a first inspection target surface of the inspection target object, and a second X-ray detector configured to inspect a second inspection target surface of the inspection target object,
the first X-ray detector includes a first X-ray receiving portion, and the second X-ray detector includes a second X-ray receiving portion,
the first inspection target surface and the second inspection target surface are arranged symmetrically with respect to a virtual plane, and
the first X-ray receiving portion and the second X-ray receiving portion are arranged to face each other via the virtual plane.
16. An inspection method of inspecting an inspection target object, comprising:
an X-ray detection step of emitting X-rays from an X-ray generation portion to the inspection target object and detecting, by a plurality of X-ray detectors, X-rays emitted from a foreign substance existing on an inspection target surface of the inspection target object and totally reflected by the inspection target surface; and
a processing step of processing outputs of the plurality of X-ray detectors,
wherein a distance between an inspection plane of the inspection target object and the X-ray generation portion is not larger than 5 mm.
17. The inspection method according to claim 16 , wherein the processing step includes a step of detecting the foreign substance.
18. The inspection method according to claim 16 , wherein the processing step includes a step of specifying a material forming the foreign substance.
19. The inspection method according to claim 16 , further comprising a step of detecting, by an X-ray detection panel, X-rays transmitted through an inspection target object having the inspection target surface,
wherein in the processing step, the output of the X-ray detector and an output of the X-ray detection panel are processed.
20. The inspection method according to claim 19 , wherein the processing step includes a step of detecting existence of the foreign substance and a position of the foreign substance based on the output of the X-ray detection panel.
21. The inspection method according to claim 19 , wherein the processing step includes a step of detecting existence of the foreign substance, a position of the foreign substance, and a size of the foreign substance based on the output of the X-ray detection panel.
22. The inspection method according to claim 16 , wherein the processing step includes a step of comparing the outputs of the plurality of X-ray detectors.