IP Library Granted Patent US 11,990,486
Granted Patent B2
US 11,990,486 · App. 17/261,061 · Granted May 21, 2024

Solid-state imaging device

Inventor: Toshiaki Ono (Kanagawa, JP)
Assignee: Sony Semiconductor Solutions Corporation
H01L27/14605B60R1/001G02B23/2407H01L27/14621H04N25/766H04N23/555
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Quick Facts
Patent No.
US 11,990,486
App. No.
17/261,061
Granted
May 21, 2024
Kind
B2
Abstract

A solid-state imaging device according to an embodiment of the present disclosure includes a stacked photoelectric converter for each of pixels. The stacked photoelectric converter has a plurality of photoelectric conversion elements stacked therein. The plurality of photoelectric conversion elements each has different wavelength selectivity. This solid-state imaging device further includes a plurality of data output lines from which pixel signals based on electric charges outputted from the photoelectric conversion elements are outputted. A plurality of data output lines is provided for each predetermined unit pixel column. The plurality of the data output lines is equal in number to an integer multiple of the photoelectric conversion elements stacked in the stacked photoelectric converter.

Claims (22)

1. A solid-state imaging device, comprising:

a stacked photoelectric converter for each of a plurality of pixels, the stacked photoelectric converter having a plurality of photoelectric conversion elements stacked therein, the plurality of photoelectric conversion elements each having different wavelength selectivity; and

a plurality of first pixel circuits, wherein one first pixel circuit is provided for each of a plurality of groups, each first pixel circuit outputting a pixel signal based on an electric charge outputted from a corresponding one of a plurality of first photoelectric conversion elements of a plurality of the photoelectric conversion elements, each of the first photoelectric conversion elements having predetermined wavelength selectivity, the groups being obtained by dividing the plurality of the first photoelectric conversion elements into the plurality of groups, wherein

the solid-state imaging device further includes a plurality of drive wiring lines to which control signals are applied, the control signals being for controlling output of electric charges accumulated in the photoelectric conversion elements, and

each of the drive wiring lines is coupled to the first photoelectric conversion elements belonging to a first group and the first photoelectric conversion elements belonging to a second group in each of a plurality of unit pixel columns corresponding to shared first pixel circuits, the plurality of the first photoelectric conversion elements belonging to the first group and the plurality of the first photoelectric conversion elements belonging to the second group sharing the different first pixel circuits.

2. The solid-state imaging device according to claim 1 , further comprising two data output lines from which the pixel signals are outputted for each of the unit pixel columns, wherein

one of the data output lines is coupled to the first pixel circuit corresponding to the first group and another of the data output lines is coupled to the first pixel circuit corresponding to the second group in each of the unit pixel columns.

3. The solid-state imaging device according to claim 1 , wherein the first photoelectric conversion elements belonging to the first group and the first photoelectric conversion elements belonging to the second group to which each of the drive wiring lines is coupled are alternately disposed in a direction parallel with the unit pixel column.

4. The solid-state imaging device according to claim 2 , further comprising a second pixel circuit for each of a plurality of groups, the second pixel circuit outputting a pixel signal based on an electric charge outputted from a second photoelectric conversion element of a plurality of the photoelectric conversion elements other than the first photoelectric conversion element, the groups being obtained by dividing a plurality of the second photoelectric conversion elements into the plurality of groups, the plurality of the second photoelectric conversion elements being included in a plurality of the photoelectric conversion elements, wherein

in a case where a plurality of the second photoelectric conversion elements belonging to a third group and a plurality of the second photoelectric conversion elements belonging to a fourth group are brought into focus, one of the data output lines is coupled to each of the second photoelectric conversion elements belonging to the third group and another of the data output lines is coupled to each of the second photoelectric conversion elements belonging to the fourth group in each of unit pixel columns corresponding to the shared first pixel circuits, the plurality of the second photoelectric conversion elements belonging to the third group and the plurality of the second photoelectric conversion elements belonging to the fourth group sharing the different second pixel circuits.

5. The solid-state imaging device according to claim 4 , wherein a plurality of the second photoelectric conversion elements includes a plurality of the photoelectric conversion elements in each of the third group and the fourth group, the plurality of the photoelectric conversion elements each having different wavelength selectivity.

6. The solid-state imaging device according to claim 1 , wherein at least one element among a plurality of the photoelectric conversion elements includes a photoelectric conversion layer in each of the stacked photoelectric converters, the photoelectric conversion layer being formed by using an organic material.

7. A solid-state imaging device, comprising:

a stacked photoelectric converter for each of a plurality of pixels, the stacked photoelectric converter having a plurality of photoelectric conversion elements stacked therein, the plurality of photoelectric conversion elements each having different wavelength selectivity;

a first pixel circuit for each of first photoelectric conversion elements of a plurality of the photoelectric conversion elements, the first photoelectric conversion elements having predetermined wavelength selectivity, each the first pixel circuits outputting a pixel signal based on an electric charge outputted from a corresponding first photoelectric conversion element; and

a second pixel circuit for each of a plurality of groups, the second pixel circuit outputting a pixel signal based on an electric charge outputted from second photoelectric conversion elements of a plurality of the photoelectric conversion elements other than the first photoelectric conversion elements, the plurality of groups being obtained by dividing a plurality of the second photoelectric conversion elements into the plurality of groups, the plurality of the second photoelectric conversion elements being included in the plurality of the photoelectric conversion elements,

wherein the solid-state imaging device further includes two data output lines from which the pixel signals are outputted for each of a plurality of pixel columns,

wherein one of the data output lines is coupled to each of the first pixel circuits and another of the data output lines is coupled to each of the second pixel circuits in each of the pixel columns, and

wherein each of the first photoelectric conversion elements includes two photoelectric conversion sections.

8. The solid-state imaging device according to claim 7 , further comprising two drive wiring lines to which control signals are applied for each of the pixel columns, the control signals being for controlling output of electric charges accumulated in the photoelectric conversion sections, wherein

one of the drive wiring lines is coupled to one of the photoelectric conversion sections and another of the drive wiring lines is coupled to another of the photoelectric conversion sections in each of pixel rows.

9. The solid-state imaging device according to claim 7 , wherein at least one element among a plurality of the photoelectric conversion elements includes a photoelectric conversion layer in each of the stacked photoelectric converters, the photoelectric conversion layer being formed by using an organic material.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 5, 2024
From: ONO, TOSHIAKI
To: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Reel/Frame 066346/0405 →
Priority Claims (1)
JP 2018-144065 · Jul 31, 2018 · national
Continuity (1)
Related Publication 20210296382A1 · Sep 23, 2021