IP Library Granted Patent US 12,078,554
Granted Patent B2
US 12,078,554 · App. 17/402,796 · Granted Sep 3, 2024

Temperature protection circuit

Inventors: Chan-Hong Chern (Palo Alto, CA); Kun-Lung Chen (Chu-pei, TW); Ming Hsien Tsai (New Taipei, TW)
Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LIMITED
G01K7/183G01K7/015G01K7/25G01R1/203G01R19/00G01R19/0092G01R27/02G01R27/08G01R27/14H01L22/34H01L2224/48227H01L2924/00H01L2924/0002
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Quick Facts
Patent No.
US 12,078,554
App. No.
17/402,796
Granted
Sep 3, 2024
Kind
B2
Abstract

A circuit includes a temperature-sensitive voltage divider. The temperature-sensitive voltage divider includes a temperature-sensitive resistor and a second resistor having a first terminal coupled to a first terminal of the temperature-sensitive resistor. A temperature signal is generated at a first node coupled to the first terminal of the temperature-sensitive resistor. Detection logic is coupled to the first node to generate a detection signal responsive to the temperature signal.

Claims (51)

1. A circuit, comprising:

a temperature-sensitive voltage divider, comprising:

a temperature-sensitive resistor; and

a second resistor;

a first inverter commonly coupled to the temperature-sensitive resistor and the second resistor at a first node, wherein:

a temperature signal is generated at the first node, and

the first inverter comprises:

a first transistor having a gate to which the temperature signal is applied; and

a third resistor coupled to a first source/drain of the first transistor at a second node, wherein a control signal is output from the first inverter at the second node.

2. The circuit of claim 1 , comprising

a second inverter coupled to the second node, wherein the second inverter comprises:

a second transistor having a gate to which the control signal is applied; and

a fourth resistor coupled to a first source/drain of the second transistor at a third node, wherein a detection signal is output from the second inverter at the third node.

3. The circuit of claim 2 , comprising:

enable logic coupled between the third node and a load.

4. The circuit of claim 1 , comprising:

a second transistor, wherein a gate of the second transistor is coupled to second node.

5. The circuit of claim 4 , wherein:

a first terminal of the second resistor is coupled to the temperature-sensitive resistor, and

a second terminal of the second resistor is coupled to a first source/drain of the second transistor.

6. The circuit of claim 5 , comprising:

a fourth resistor, wherein:

a first terminal of the fourth resistor is coupled to the first source/drain of the second transistor, and

a second terminal of the fourth resistor is coupled to a second source/drain of the second transistor.

7. The circuit of claim 1 , wherein the second resistor is a temperature-insensitive resistor.

8. The circuit of claim 4 , wherein the gate of the second transistor is directly coupled to second node.

9. A circuit, comprising:

a temperature-sensitive resistor; and

detection logic comprising:

a first transistor having a gate coupled to a first terminal of the temperature-sensitive resistor; and

a second transistor having a first source/drain coupled to a first source/drain of the first transistor and a second source/drain coupled to a second terminal of the temperature-sensitive resistor.

10. The circuit of claim 9 , comprising:

a second resistor coupled to the first terminal of the temperature-sensitive resistor.

11. The circuit of claim 10 , wherein a first terminal of the second resistor, the first terminal of the temperature-sensitive resistor, and the gate of the first transistor are commonly coupled.

12. The circuit of claim 10 , comprising:

a third transistor, wherein:

a first source/drain of the third transistor is coupled to a second source/drain of the second transistor, and

a second source/drain of the third transistor is coupled to a second terminal of the second resistor.

13. The circuit of claim 10 , wherein the second resistor is a temperature-insensitive resistor.

14. The circuit of claim 9 , wherein the second terminal of the temperature-sensitive resistor is coupled to ground.

15. The circuit of claim 9 , wherein the detection logic comprises a third transistor having a first source/drain coupled to the first source/drain of the first transistor and a gate coupled to a reference voltage source.

16. A circuit, comprising:

a temperature-sensitive voltage divider, comprising:

a temperature-sensitive resistor; and

a second resistor;

a first inverter having an input terminal coupled to a first terminal of the temperature-sensitive resistor; and

a shunting transistor having a gate coupled to an output terminal of the first inverter and a first source/drain coupled to a first terminal of the second resistor.

17. The circuit of claim 16 , comprising a second inverter having an input terminal coupled to the output terminal of the first inverter.

18. The circuit of claim 16 , wherein the shunting transistor has a second source/drain coupled to a second terminal of the second resistor.

19. The circuit of claim 16 , wherein the shunting transistor has a body coupled to a second terminal of the second resistor.

20. The circuit of claim 16 , wherein the second resistor is a temperature-insensitive resistor.

Continuity (3)
Continuation 16458585 · Jul 1, 2019
Provisional Application 62753125 · Oct 31, 2018
Related Publication 20210372859A1 · Dec 2, 2021