IP Library Granted Patent US 12,308,355
Granted Patent B2
US 12,308,355 · App. 17/549,615 · Granted May 20, 2025

Semiconductor device and semiconductor module

Inventors: Takayuki Tsutsui (Nagaokakyo, JP); Yuichi Saito (Nagaokakyo, JP)
Assignee: Murata Manufacturing Co., Ltd.
H01L25/16H01L24/08H01L24/24H03F3/45475H01L24/13H01L2224/08145H01L2224/13144H01L2224/13147H01L2224/1357H01L2224/24105H01L2224/24146H01L2924/10253H01L2924/10329H01L2924/13091H01L2924/1421H03F2200/06H03F2200/451
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Quick Facts
Patent No.
US 12,308,355
App. No.
17/549,615
Granted
May 20, 2025
Kind
B2
Abstract

A semiconductor device includes first member that includes a switch made of a semiconductor element made from an elemental semiconductor. The first member is joined to a second member including a radio-frequency circuit including a semiconductor element made from a compound semiconductor. The switch and the radio-frequency circuit are connected by a path. The path includes an inter-member connection wire made of a metal pattern arranged on an interlayer insulating film extending from a surface of the second member to a surface of the first member or a conductive member allowing a current to flow in a direction crossing an interface where the first member and the second member are joined.

Claims (45)

1. A semiconductor device comprising:

a first member including a switch made of a semiconductor element made from an elemental semiconductor;

a second member including a radio-frequency circuit including a semiconductor element made from a compound semiconductor, the second member joined to the first member; and

a path connecting the switch and the radio-frequency circuit,

wherein the path includes an inter-member connection wire made of a metal pattern arranged on an interlayer insulating film extending from a surface of the second member to a surface of the first member or a conductive member allowing a current to flow across a surface joining the first member and the second member.

2. The semiconductor device according to claim 1 , wherein

the radio-frequency circuit includes a differential amplifier circuit, and

the semiconductor device further comprises a variable capacitance circuit connected between a pair of wires, the variable capacitance circuit being configured to allow transmission of a differential signal into the differential amplifier circuit, the variable capacitance circuit includes a capacitor and the switch, and capacitance between the pair of the wires is changed by turning on or off of the switch.

3. The semiconductor device according to claim 2 , wherein

the capacitor included in the variable capacitance circuit is disposed in the first member.

4. The semiconductor device according to claim 2 , further comprising:

a first balun configured to convert a single-end signal into a differential signal to be input into the differential amplifier circuit; and

a second balun configured to convert a differential signal output from the differential amplifier circuit into a single-end signal.

5. The semiconductor device according to claim 4 , wherein

the first balun and the second balun are disposed in the first member.

6. The semiconductor device according to claim 4 , further comprising:

a driver-stage amplifier circuit configured to output a single-end signal to be input into the first balun.

7. The semiconductor device according to claim 4 , further comprising:

a power-stage differential amplifier circuit configured to amplify a signal output from the differential amplifier circuit and output a differential signal to be input into the second balun.

8. The semiconductor device according to claim 5 , further comprising:

a driver-stage amplifier circuit configured to output a single-end signal to be input into the first balun.

9. The semiconductor device according to claim 5 , further comprising:

a power-stage differential amplifier circuit configured to amplify a signal output from the differential amplifier circuit and output a differential signal to be input into the second balun.

10. A semiconductor module comprising:

a semiconductor device including a first member including a switch made of a semiconductor element made from an elemental semiconductor and a second member including a radio-frequency circuit including a semiconductor element made from a compound semiconductor, the second member joined to the first member, the semiconductor device further including a first conductive protrusion connected to the switch and a second conductive protrusion connected to the radio-frequency circuit;

a module substrate on which the semiconductor device is mounted; and

a path connecting the switch and the radio-frequency circuit, the path including the first conductive protrusion, a wire disposed on the module substrate, and the second conductive protrusion.

11. The semiconductor module according to claim 10 , wherein

the radio-frequency circuit includes a differential amplifier circuit, and

the semiconductor module further comprises a variable capacitance circuit connected between a pair of wires, the variable capacitance circuit being configured to allow transmission of a differential signal into the differential amplifier circuit, the variable capacitance circuit includes a capacitor and the switch, and capacitance between the pair of the wires is changed by turning on or off of the switch.

12. The semiconductor module according to claim 11 , wherein

the capacitor included in the variable capacitance circuit is disposed in the first member.

13. The semiconductor module according to claim 11 , further comprising:

a first balun configured to convert a single-end signal into a differential signal to be input into the differential amplifier circuit; and

a second balun configured to convert a differential signal output from the differential amplifier circuit into a single-end signal.

14. The semiconductor module according to claim 13 , wherein

the first balun and the second balun are disposed in the first member.

15. The semiconductor module according to claim 13 , further comprising:

a driver-stage amplifier circuit configured to output a single-end signal to be input into the first balun.

16. The semiconductor module according to claim 13 , further comprising:

a power-stage differential amplifier circuit configured to amplify a signal output from the differential amplifier circuit and output a differential signal to be input into the second balun.

17. The semiconductor module according to claim 14 , further comprising:

a driver-stage amplifier circuit configured to output a single-end signal to be input into the first balun.

18. The semiconductor module according to claim 14 , further comprising:

a power-stage differential amplifier circuit configured to amplify a signal output from the differential amplifier circuit and output a differential signal to be input into the second balun.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 13, 2021
From: TSUTSUI, TAKAYUKI; SAITO, YUICHI
To: MURATA MANUFACTURING CO., LTD.
Reel/Frame 058376/0574 →
Priority Claims (1)
JP 2020-206896 · Dec 14, 2020 · national
Continuity (1)
Related Publication 20220189936A1 · Jun 16, 2022
References Cited (7)
US 5834975A · Bartlett · 1998 [cited by examiner]
US 20070210866A1 · Sato · 2007 [cited by examiner]
US 20090289721A1 · Rajendran et al. · 2009 [cited by applicant]
US 20150349731A1 · Kwon et al. · 2015 [cited by applicant]
US 20190296703A1 · Ortiz et al. · 2019 [cited by applicant]
JP 2001053179A · 2001 [cited by applicant]
JP 2020136729A · 2020 [cited by applicant]