IP Library Granted Patent US 12,341,513
Granted Patent B2
US 12,341,513 · App. 17/979,731 · Granted Jun 24, 2025

Driving voltage generating device

Inventors: Wei-Fan Chen (Taichung, TW); Kuo-Chi Tsai (Taoyuan, TW)
Assignee: LEAP Semiconductor Corp.
H03K19/21H02H5/04H02M3/07H03K17/08122H03K2017/0806
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Quick Facts
Patent No.
US 12,341,513
App. No.
17/979,731
Granted
Jun 24, 2025
Kind
B2
Abstract

A driving voltage generating device includes a temperature detector, a controlling circuitry, a voltage generator, and an output stage circuitry. The temperature detector is coupled to a control terminal of a power transistor and is configured to generate temperature detection information by detecting an ambient temperature. The controlling circuitry is coupled to the temperature detector and generates an activation signal by determining whether the ambient temperature is abnormal according to the temperature detection information. The voltage generator generates an operation power according to the activation signal. The output stage circuitry is coupled to the voltage generator, generates a driving voltage according to the operation power, and provides the driving voltage to the control terminal of the power transistor.

Claims (48)

1. A driving voltage generating device configured to drive a power transistor, the driving voltage generating device comprising:

a temperature detector coupled to a control terminal of the power transistor, and configured to generate temperature detection information by detecting an ambient temperature;

a controlling circuitry coupled to the temperature detector, and generating an activation signal by determining whether the ambient temperature is abnormal according to the temperature detection information;

a voltage generator generating an operation power according to the activation signal; and

an output stage circuitry coupled to the voltage generator, generating a driving voltage according to the operation power, and providing the driving voltage to the control terminal of the power transistor.

2. The driving voltage generating device according to claim 1 , wherein the controlling circuitry generates the activation signal when the ambient temperature is greater than a predetermined threshold, such that the voltage generator ceases outputting the operation power.

3. The driving voltage generating device according to claim 2 , wherein the controlling circuitry generates the activation signal by perform a logical operation on the temperature detection information and predetermined threshold information, wherein the predetermined threshold information comprises a digital value of the predetermined threshold.

4. The driving voltage generating device according to claim 3 , wherein the controlling circuitry comprises:

a plurality of AND gates respectively receiving a plurality of bits of the temperature detection information, and respectively receiving a plurality of bits of the predetermined threshold information; and

a NOR gate having a plurality of input terminals coupled to output terminals of the AND gates, wherein the NOR gate generates the activation signal.

5. The driving voltage generating device according to claim 1 , wherein the voltage generator comprises:

an oscillator generating a clock signal according to the activation signal; and

a charge pump circuit coupled to the oscillator, and generating the operation power according to the clock signal and based on a power voltage.

6. The driving voltage generating device according to claim 1 , wherein the output stage circuitry comprises:

a first transistor having a first terminal that receives the operation power and a control terminal that receives a first control signal;

a second transistor having a first terminal that receives a reference ground voltage and a control terminal that receives a second control signal;

a first diode having an anode terminal coupled to a second terminal of the first transistor; and

a second diode has a cathode terminal coupled to a second terminal of the second transistor,

wherein an anode terminal of the second diode and a cathode terminal of the first diode are coupled to each other and provide the driving voltage.

7. The driving voltage generating device according to claim 6 , wherein the output stage circuitry further comprises:

a first resistor coupled between the cathode terminal of the first diode and the control terminal of the power transistor; and

a second resistor coupled between the anode terminal of the second diode and the control terminal of the power transistor.

8. The driving voltage generating device according to claim 1 , wherein the temperature detector comprises:

a first resistor and a second resistor coupled in series between the control terminal of the power transistor and a reference ground voltage, wherein the first resistor and the second resistor generate a monitoring voltage by dividing the driving voltage on the control terminal of the power transistor; and

an operational circuit coupled to the first resistor and the second resistor, generating a plurality of comparison results by comparing the monitoring voltage with a plurality of reference voltages, and generating the temperature detection information by performing an operation on the comparison results,

wherein the first resistor is a poly-silicon resistor and the second resistor is a silicon carbide diffusion resistor.

9. The driving voltage generating device according to claim 8 , wherein the operational circuit comprises:

a plurality of comparators respectively receiving the reference voltages, collectively receiving the monitoring voltage, and configured to generate the comparison results by comparing the monitoring voltage with the corresponding reference voltages; and

a plurality of logical operators, wherein each of the logical operators performs a logical operation on two of the comparison results, and the logical operators are respectively configured to generate a plurality of bits of the temperature detection information.

10. The driving voltage generating device according to claim 9 , wherein each of the logical operators is an XOR gate or an XNOR gate.

11. The driving voltage generating device according to claim 9 , wherein the reference voltages comprise a first reference voltage to an N-th reference voltage arranged in order of magnitude, the comparators comprise a first comparator to an N-th comparator respectively corresponding to the first reference voltage to the N-th reference voltage, and the comparators respectively generate a first comparison result to an N-th comparison result,

wherein each of the logical operators receives an i-th comparison result and the i+1-th comparison result, and generates an i-th bit of the temperature detection information, where N is a positive integer greater than 1, and i is a positive integer greater than 0 and less than N.

12. The driving voltage generating device according to claim 9 , wherein the operational circuit further comprises:

a plurality of transmission switches respectively coupled to output terminals of the logical operators, and outputting the bits of the temperature detection information according to a control signal.

13. The driving voltage generating device according to claim 8 , wherein the temperature detector further comprises a reference voltage generator coupled to the operational circuit, the reference voltage generator being configured to generate the reference voltages and comprising:

a voltage-dividing circuit having a first terminal that receives a second voltage and a second terminal that receives a third voltage, wherein the voltage-dividing circuit generates the reference voltages by dividing a difference of dividing the second voltage and the third voltage.

14. The driving voltage generating device according to claim 13 , wherein the voltage-dividing circuit comprises:

a plurality of third resistors sequentially coupled in series between the second voltage and the third voltage, wherein the third resistors generates the reference voltages by dividing a difference of dividing the second voltage and the third voltage, and the third resistors are poly-silicon resistors.

15. The driving voltage generating device according to claim 8 , wherein the temperature detector further comprises a reference voltage generator coupled to the operational circuit, the reference voltage generator being configured to generate the reference voltages and comprising:

a plurality of voltage-dividing circuits respectively configured to generate the reference voltages, each of the voltage-dividing circuits comprising:

a third resistor and a fourth resistor connected in series with each other between a second voltage and a third voltage, and configured to generate the corresponding reference voltage by dividing a voltage difference between the second voltage and the third voltage, wherein the third resistor and the fourth resistor are poly-silicon resistors.

16. The driving voltage generating device according to claim 8 , wherein a first terminal of the first resistor is coupled to the control terminal of the power transistor, a second terminal of the first resistor is coupled to a first terminal of the second resistor, and a second terminal of the second resistor receives the reference ground voltage.

17. The driving voltage generating device according to claim 8 , wherein a first terminal of the second resistor is coupled to the control terminal of the power transistor, a second terminal of the second resistor is coupled to a first terminal of the first resistor, and a second terminal of the first resistor receives the reference ground voltage.

18. The driving voltage generating device according to claim 8 , wherein the second resistor is an N-type silicon carbide diffusion resistor or a P-type silicon carbide diffusion resistor.

19. The driving voltage generating device according to claim 8 , wherein, when the second resistor is a P-type silicon carbide diffusion resistor, the second resistor comprises:

a P-type diffusion region disposed in a drift region.

20. The driving voltage generating device according to claim 8 , wherein, when the second resistor is an N-type silicon carbide diffusion resistor, the second resistor comprises:

an N-type diffusion region disposed in a well region, wherein the well region is disposed in a drift region.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 10, 2022
From: CHEN, WEI-FAN; TSAI, KUO-CHI
To: LEAP SEMICONDUCTOR CORP.
Reel/Frame 061726/0316 →
Priority Claims (1)
TW 111136340 · Sep 26, 2022 · national
Continuity (1)
Related Publication 20240102868A1 · Mar 28, 2024
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