Granted Patent B2

US 12,367,365 · App. 18/034,097 · Granted Jul 22, 2025

Inventor: Thomas Craig Weakley (Simpsonville, SC)

Assignee: CHECKPOINT SYSTEMS, INC.

G06K19/0722G06K7/10356

Abstract

Claims (48)

1. A test system comprising:

a test interface without moving parts, the test interface comprising:

an array of antennas,

a radio frequency identification (RFID) reader to interrogate an array of RFID inlays to be tested; and

a circuit configured to selectively connect the RFID reader to the antenna in the array of antennas;

wherein the test interface performs a testing sequence comprising a primary scan of all of the RFID inlays in the array of RFID inlays to be tested and, when not all of the RFID inlays in the array of RFID inlays respond, a secondary scan to interrogate a subset of the RFID inlays in the array of RFID inlays to determine which of the RFID inlays failed to respond; and

a marking device to mark any of the identified RFID inlays that failed to respond.

2. The test system of claim 1 , wherein the array of antennas is a two-dimensional array of antennas.

3. The test system of claim 1 , wherein the array of antennas includes twenty-four antennas.

4. The test system of claim 1 , wherein to perform the secondary scan, the test interface interrogates multiple subsets of the RFID inlays to be tested.

5. The test system of claim 4 , wherein the subsets are categorized into four configurations, wherein each antenna is used once in each of the configurations.

6. The test system of claim 5 , wherein each of the configurations includes multiple subsets, each of the subsets including four of the antenna to be used to interrogate the RFID inlays to be tested.

7. The test system of claim 6 , wherein none of the subsets across all of the configurations include identical combinations of the antenna.

8. The test system of claim 4 , wherein, for each subset, the test interface records all of the RFID inlays in the subset as having a failure when not all of the RFID inlays in the subset respond.

9. The test system of claim 8 , wherein, for each of the RFID inlays to be tested, the test interface determines which of the RFID inlays failed to respond by:

comparing a number of times the RFID inlay has been recorded as having a failure to a failure threshold; and

determining that the RFID inlay has failed to respond when the number of times the RFID inlay has been recorded as having a failure meets or exceeds the failure threshold.

10. The test system of claim 1 , wherein to perform the secondary scan, the test interface interrogates each RFID inlay to be tested individually.

11. The test system of claim 1 , wherein the testing sequence is performed with the RFID reader set at a first frequency-power level pair, and wherein the test interface repeats the testing sequence with the RFID reader set at a second frequency-power level pair, the second frequency-power level pair being different than the first frequency-power level pair.

12. The test system of claim 11 , wherein the test interface repeats the query with the RFID reader set at a third frequency-power level pair, the third frequency-power level pair being different than the first and the second frequency-power level pairs.

13. A method to test radio frequency identification (RFID) inlays, the method comprising:

moving an array of RFID inlays to be tested into a test interface including an array of antennas;

performing, by the test interface, a primary scan of all of the RFID inlays in the array of RFID inlays to be tested without moving any of the antennas and without associating any response from the RFID inlays to any of the antennas;

in response to receiving responses from all of the RFID inlays in the array of RFID inlays to be tested, determining that all of the RFID inlays to be tested are functional;

in response to receiving responses from less than all of the RFID inlays in the array of RFID inlays to be tested; performing a secondary scan of a subset of RFID inlays in the array of RFID inlays to determine which of the RFID inlays are defective; and

marking the RFID inlays that are defective.

14. The method of claim 13 , wherein performing the secondary scan comprises individually interrogating each of the RFID inlays to be tested to determine which of the RFID inlays are defective.

15. The method of claim 13 , wherein performing the secondary scan comprises interrogating multiple subsets of the RFID inlays to be tested to determine which of the RFID inlays are defective, each of the subsets including multiple of the RFID inlays to be tested.

16. The method of claim 15 , wherein none of the subsets include a same combination of the RFID inlays to be tested as any other subset.

17. The method of claim 15 , wherein after interrogating each of the multiple subsets of the RFID, recording all of the RFID inlays in the subset as having a failure when the testing interface does not receive responses from all of the RFID inlays in the subset.

18. The method of claim 17 , wherein, for each the RFID inlay, determining which of the RFID inlays are defective comprises:

comparing a number of times the RFID inlay has been recorded as having a failure to a failure threshold; and

determining that the RFID inlay is defective when the number of times the RFID inlay has been recorded as having a failure meets or exceeds the failure threshold.

19. The method of claim 17 , wherein determining which of the RFID inlays are defective comprises:

determining a highest number of times that any one of the RFID inlays has been recorded as having a failure; and

for each of the RFID inlays, determining that the RFID inlay is defective when the number of times the RFID inlay has been recorded is equal to the highest number.

20. The method of claim 13 , wherein the array of antennas is a two-dimensional array.

21. The method of claim 13 , wherein the query of all the RFID inlays in the array is performed with an RFID reader set at a first frequency-power level pair, and wherein the test interface repeats the query with the RFID reader set at a second frequency-power level pair, the second frequency-power level pair being different than the first frequency-power level pair.

22. The method of claim 21 , wherein the query is performed with the RFID reader set at a third frequency-power level pair, the third frequency-power level pair being different than the first and the second frequency-power level pairs.

23. A method comprising:

moving radio frequency identification (RFID) labels to be tested into a test interface that includes a two-dimensional array of antennas;

performing, by the test interface, a query of all of the RFID labels to be tested without moving any of the antennas and without associating any response from the RFID labels to any of the antennas;

in response to receiving responses from all of the RFID labels to be tested, determining that all of the RFID labels to be tested are not defective;

in response to receiving responses from less than all of the RFID labels to be tested:

interrogating multiple subsets of the RFID labels to be tested to determine which of the RFID labels are defective, each of the subsets including multiple of the RFID labels to be tested;

for each of the subsets for which the test interface does not receive responses from all of the RFID labels in the subset, recording all of the RFID labels in the subset as having a failure;

after all of the subsets are tested, comparing a number of times the RFID label has been recorded as having a failure to a failure threshold, and determining that the RFID label is defective when the number of times the RFID label has been recorded as having a failure meets or exceeds the failure threshold; and

marking the RFID labels that are defective.

Assignments (1)

Continuity (2)

References Cited (14)