Mitigating impact of ion buildup on pH sensor
View Patent ↗A method of predicting a vibration event is comprised of the following: time stamping a set of vibration events initiated by a processor adapted to control when a vibration source is activated relative to a sample event; recording a vibration action for each event in the set of vibration events including at least one of a sampling solution type, a vibration element type, a proximity of a vibration element to a sample element, a sample mode, a time to a next sample event, or a degree of solution activity; and predicting at least one of a type or a time of a next vibration action based on the vibration action record.
1. A method of predicting a vibration event, the method comprising:
time stamping a set of vibration events initiated by a processor adapted to control when a vibration source is activated relative to a sample event;
recording a vibration action for each event in the set of vibration events including at least one of a sampling solution type, a vibration element type, a proximity of a vibration element to a sample element, a sample mode, a time to a next sample event, or a degree of solution activity; and
predicting at least one of a vibration type or a vibration time of a next vibration source activation based on the vibration action record.
2. The method of claim 1 , wherein time stamping is in reference to a time keeping source that indicates a duration of time since a last vibration event.
3. The method of claim 1 , further including determining if the next vibration source activation is to be performed as predicted based on an amount of time since a last vibration event.
4. The method of claim 1 , wherein predicting a time of a next vibration source activation is further based on a vibration profile associated with the next vibration action.
5. The method of claim 4 , wherein the vibration profile includes a set of vibration control parameters that includes at least one of amplitude, duration, waveform shape, or timing of vibration relative to sampling and that represents a subset of preferred vibration control parameters configured in the vibration profile.
6. The method of claim 1 , wherein predicting a time of a next vibration source activation is based on feedback indicating an impact on sampling integrity for each of the recorded vibration actions.
7. The method of claim 1 , wherein predicting a time for a next vibration source activation is adapted based on at least one of a measure of ion buildup relative to a tip of a probe or an estimate of ion buildup relative to the tip of the probe for performing the next sample event.
8. A method of using a vibration profile for predicting a vibration event, the method comprising:
time stamping a set of vibration events initiated by a processor adapted to control when a vibration source is activated relative to a sample event;
recording a vibration action for each event in the set of vibration events including at least one of a sampling solution type, a vibration element type, a proximity of a vibration element to a sample element, a sample mode, a time to a next sample event, or a degree of solution activity;
selecting a vibration profile for a next sample event; and
predicting at least one of a vibration type or a vibration time of a vibration source activation for the next sampling event based on the vibration action record and the selected vibration profile.
9. The method of claim 8 , wherein the vibration profile is selected by:
recording at least one of vibration amplitude, vibration duration, and a set of sample delay parameters for each of a set of pH samples in a sample history;
determining a tolerance band indicating a range of preferred sample values;
determining a subset of entries in the sample history that include sample values in the tolerance band; and
selecting a vibration profile for vibrating a probed solution, the selected vibration profile including a set of vibration control parameters that includes at least one of amplitude, duration, waveform shape, or timing of vibration relative to sampling that represent the subset of entries in the sample history.
10. The method of claim 8 , wherein time stamping is in reference to a time keeping source that indicates a duration of time since a last vibration event.
11. The method of claim 8 , further including determining if the next vibration source activation is to be performed as predicted based on an amount of time since a last vibration event.
12. The method of claim 8 , wherein predicting a time of a next vibration source activation is further based on a vibration profile associated with the next vibration action.
13. The method of claim 12 , wherein the vibration profile includes a set of vibration control parameters that includes at least one of amplitude, duration, waveform shape, or timing of vibration relative to sampling and that represents a subset of preferred vibration control parameters configured in the vibration profile.
14. The method of claim 8 , wherein predicting a time of a next vibration source activation is based on feedback indicating an impact on sampling integrity for each of the recorded vibration actions.
15. The method of claim 8 , wherein predicting a time for a next vibration source activation is adapted based on at least one of a measure of ion buildup relative to a tip of a probe or an estimate of ion buildup relative to the tip of the probe for performing the next sample event.
16. A system for predicting a vibration event, the system comprising:
a set of time-stamped vibration event records configured by a processor adapted to control when a vibration source is activated relative to a sample event, the set of vibration events including at least one of a sampling solution type, a vibration element type, a proximity of a vibration element to a sample element, a sample mode, a time to a next sample event, or a degree of solution activity;
a vibration profile comprising a set of vibration control parameters that includes at least one of amplitude, duration, waveform shape, or timing of vibration relative to sampling and that represents a subset of preferred vibration control parameters configured in the vibration profile; and
a processor executing a set of instructions that facilitate predicting at least one of a vibration type or a vibration time of a next vibration source activation based on the vibration action record and the vibration profile.
17. The system of claim 16 , wherein the vibration profile is derived by:
recording at least one of vibration amplitude, vibration duration, and a set of sample delay parameters for each of a set of pH samples in a sample history;
determining a tolerance band indicating a range of preferred sample values;
determining a subset of entries in the sample history that include sample values in the tolerance band; and
configuring a set of vibration control parameters that includes at least one of amplitude, duration, waveform shape, or timing of vibration relative to sampling that represent the subset of entries in the sample history.
18. The system of claim 16 , wherein predicting a time of a next vibration source activation is based on feedback indicating an impact on sampling integrity for each of the recorded vibration actions.
19. The system of claim 16 , wherein predicting a time for a next vibration source activation is adapted based on at least one of a measure of ion buildup relative to a tip of a probe or an estimate of ion buildup relative to the tip of the probe for performing the next sample event.
20. The system of claim 16 , wherein a time stamp of a vibration event record is in reference to a time keeping source that indicates a duration of time since a last vibration event.