Hardened optical windows for LIDAR applications at 850-950NM
A window for a sensing system is provided. The window includes a substrate having a predetermined thickness and an index of refraction for electromagnetic radiation having a wavelength of 905 nm and a layered film disposed on the substrate, the layered film including alternating layers of a high refractive index material and a lower refractive index material, the high refractive index material having a higher refractive index than the lower refractive index material, wherein each layer of the alternating layers of the layered film has a thickness, and the thicknesses of the alternating layers are configured so that the window has a transmittance of at least 80% for electromagnetic radiation having a wavelength within the range of 850 nm to 950 nm. The window further includes a hardness of at least 10 GPa, at the layered film, as measured by the Berkovich Indenter Hardness Test.
1. A window for a sensing system comprising:
a substrate having a predetermined thickness and an index of refraction for electromagnetic radiation having a wavelength of 905 nm;
a layered film disposed on the substrate, the layered film comprising alternating layers of a high refractive index material and a lower refractive index material, the high refractive index material having a higher refractive index than the lower refractive index material and comprising one or more of Si 3 N 4 , SiN x , AlN x , SiO x N y , and AlO x N y , wherein each layer of the alternating layers of the layered film has a thickness, and the thicknesses of the alternating layers are configured so that the window has a transmittance of at least 80% for electromagnetic radiation having a wavelength within the range of 850 nm to 950 nm; and
a hardness of at least 10 GPa, at the layered film, as measured by the Berkovich Indenter Hardness Test.
2. The window of claim 1 , wherein the substrate comprises an acrylic sheet that has a transmittance of less than 1% for a range of wavelengths within the visible spectrum, and a transmittance of greater than 85% at a wavelength of 905 nm.
3. The window of claim 1 , wherein the layered film comprises a quantity of layers, and wherein the quantity of layers, as well as the thicknesses of the alternating layers, are configured so that the window has a transmittance of at least 95% for electromagnetic radiation having a wavelength within the range of 850 nm to 950 nm.
4. The window of claim 1 , wherein the lower refractive index material comprises one or more of SiO 2 , Al 2 O 3 , AlO x N y , and SiO x N y , the oxygen content in SiO x N y , AlO x N y for the high refractive index material being lower than the oxygen content in SiO x N y , AlO x N y for the lower refractive index material, and the nitrogen content in SiO x N y , AlO x N y for the high refractive index material being higher than the nitrogen content in SiO x N y , AlO x N y for the lower refractive index material.
5. The window of claim 1 , wherein the thicknesses of the alternating layers of the layered film are configured so that the window has: (a) an average transmittance of greater than 95% for electromagnetic radiation having a wavelength of 905 nm; and (b) an average reflectance of less than 1% at an angle of incidence from 0° to 8° for electromagnetic radiation having a wavelength of 905 nm.
6. The window of claim 5 , wherein:
the thicknesses of the alternating layers of the layered film are configured so that the window has an average transmittance of greater than 80% for electromagnetic radiation having a wavelength of 1550 nm, and
the thicknesses of the alternating layers of the layered film are configured so that the window has an average reflectance of more than 80% at an angle of incidence within the range of 0° to 8° for electromagnetic radiation having wavelengths within the range of 400 nm to 700 nm.
7. The window of claim 1 , wherein the substrate comprises a first surface, on which the layered film is disposed, and a second surface on which a second layered film is disposed, the second layered film comprising alternating layers of the high refractive index material and the lower refractive index material,
wherein both the layered film and the second layered film comprise a quantity of layers each having a thickness, the quantity of layers for both the layered film and the second layered film, as well as the thicknesses of the alternating layers of both the layered film and the second layered film, being configured so that the window has a transmittance of at least 80% for electromagnetic radiation having a wavelength within the range of 850 nm to 950 nm, and
wherein the layered film includes the thickest layer of the high refractive index material of the window.
8. The window of claim 1 , wherein the sensing system comprises a LIDAR system.
9. A window for a sensing system comprising:
a substrate having a predetermined thickness and an index of refraction for electromagnetic radiation having a wavelength of 905 nm;
a layered film disposed on the substrate, the layered film comprising alternating layers of a high refractive index material and a lower refractive index material, the high refractive index material having a higher refractive index than the lower refractive index material, wherein each layer of the alternating layers of the layered film has a thickness, and the thicknesses of the alternating layers are configured so that the window has a transmittance of at least 80% for electromagnetic radiation having a wavelength within the range of 850 nm to 950 nm; and
a hardness of at least 10 GPa, at the layered film, as measured by the Berkovich Indenter Hardness Test, wherein the substrate is a glass substrate formed of an alkali aluminosilicate or alkali aluminoborosilicate glass with a surface and a region contiguous with the surface that is under compressive stress.
10. The window of claim 9 , wherein the glass substrate has a thickness between about 1 mm and about 5 mm, the compressive stress has a maximum absolute value of at least 600 MPa, and the region under compressive stress has a depth of compression of at least 20 μm.
11. A window for a sensing system comprising:
a substrate having a predetermined thickness and an index of refraction for electromagnetic radiation having a wavelength of 905 nm;
a layered film disposed on the substrate, the layered film comprising alternating layers of a high refractive index material and a lower refractive index material, the high refractive index material having a higher refractive index than the lower refractive index material, wherein each layer of the alternating layers of the layered film has a thickness, and the thicknesses of the alternating layers are configured so that the window has a transmittance of at least 80% for electromagnetic radiation having a wavelength within the range of 850 nm to 950 nm; and
a hardness of at least 10 GPa, at the layered film, as measured by the Berkovich Indenter Hardness Test, wherein the layered film has a thickness, and wherein the layered film comprises a layer of the high refractive index material that has a thickness that is 50% or more of the thickness of the layered film.
12. The window of claim 11 , wherein the layer of the high refractive index material has a thickness of between about 500 nm and about 10,000 nm.
13. A window for a sensing system comprising:
a substrate having a predetermined thickness and an index of refraction for electromagnetic radiation having a wavelength of 905 nm;
a layered film disposed on the substrate, the layered film comprising alternating layers of a high refractive index material and a lower refractive index material, the high refractive index material having a higher refractive index than the lower refractive index material, wherein each layer of the alternating layers of the layered film has a thickness, and the thicknesses of the alternating layers are configured so that the window has a transmittance of at least 80% for electromagnetic radiation having a wavelength within the range of 850 nm to 950 nm; and
a hardness of at least 10 GPa, at the layered film, as measured by the Berkovich Indenter Hardness Test, wherein the layer of the layered film that is farthest away from the glass substrate forms a terminal surface material of the window, the terminal surface material of the window comprising the lower refractive index material, and
wherein the terminal surface material of the window has a thickness that is between about 130 nm and about 180 nm or wherein the thickest layer of the high refractive index material in the layered film is adjacent to the terminal surface material of the window.
14. A window for a sensing system comprising:
a glass substrate having a predetermined thickness and an index of refraction for electromagnetic radiation having a wavelength of 905 nm;
a layered film disposed on the glass substrate, the layered film including a quantity of at least seven alternating layers of Si 3 N 4 and SiO 2 , the layers of Si 3 N 4 having a higher refractive index than the layers of SiO 2 , wherein each layer of the alternating layers of the layered film has a thickness, and the thicknesses of the alternating layers are configured so that the window has a transmittance of at least 80% for electromagnetic radiation having a wavelength within the range of 850 nm to 950 nm; and
a hardness of at least 8 GPa, at the layered film, as measured by the Berkovich Indenter Hardness Test.
15. The window of claim 14 , wherein the hardness, at the layered film, as measured by the Berkovich Indenter Hardness Test is at least 10 GPa.
16. The window of claim 14 , wherein the layer of SiO 2 that is farthest away from the glass substrate comprises a terminal surface material of the window, and wherein the thickest layer of Si 3 N 4 in the layered film is adjacent to the terminal surface material.
17. The window of claim 14 , wherein the thickest layer of Si 3 N 4 in the layered film has a thickness within the range of about 500 nm to about 10,000 nm.
18. The window of claim 14 , wherein the thicknesses of the alternating layers are configured so that the window has: (a) an average transmittance of greater than 95% for electromagnetic radiation having a wavelength of 905 nm; (b) an average reflectance of less than 1% at an angle of incidence within the range of 0° to 8° for electromagnetic radiation having a wavelength of 905 nm, and an average reflectance of more than 80% at an angle of incidence within the range of 0° to 8° for electromagnetic radiation having wavelengths within the range of 400 nm to 700 nm.
19. The window of claim 14 , wherein the thicknesses of the alternating layers are configured so that the window has an average transmittance of greater than 80% for electromagnetic radiation having a wavelength of 1550 nm.