Granted Patent B2

US 12,435,972 · App. 17/609,341 · Granted Oct 7, 2025

Inventors: Atsuhiro Hibi (Tokyo, JP); Yusuke Konno (Tokyo, JP); Nobuhiro Furuya (Tokyo, JP); Akihito Nakazaki (Tokyo, JP)

Assignee: NIPPON STEEL CORPORATION

G01B11/25

Abstract

Claims (50)

1. A surface measurement apparatus that measures a surface of an object to be measured moving in a predetermined moving direction on a plane or a surface of an object to be measured moving in a predetermined moving direction along a curved surface of a roll, the surface being along the curved surface, the apparatus comprising:

N (N being an integer of two or more) light sources provided in a width direction, the light sources each emitting line beam over the width direction, which is a direction perpendicular to the moving direction;

a screen on which reflected images of N pieces of the line beam reflected on reflection regions of the surface of the object to be measured respectively are projected;

an image capturing device that captures the reflected image projected on the screen and acquires a captured image; and

an arithmetic processing device that measures the surface of the object to be measured by using the captured image, wherein

the N light sources are arranged so as to make at least incident angles of the line beams adjacent in the width direction on the surface of the object to be measured same,

the N light sources are arranged so as to make positions of the reflection regions on the surface of the object to be measured in the moving direction different, and

the N light sources are arranged so as to make each reflection region that is projected in which the reflection region on the surface of the object to be measured is projected in the moving direction of the object to be measured overlap an adjacent reflection region that is projected in the width direction of the object to be measured.

2. A surface measurement apparatus that measures a surface of an object to be measured moving in a predetermined moving direction on a plane or a surface of an object to be measured moving in a predetermined moving direction along a curved surface of a roll, the surface being along the curved surface, the apparatus comprising:

N (N being an integer of two or more) light sources provided in a width direction, the light sources each emitting line beam over the width direction, which is a direction perpendicular to the moving direction;

a screen on which reflected images of N pieces of the line beam reflected on reflection regions of the surface of the object to be measured respectively are projected;

an image capturing device that captures the reflected image projected on the screen and acquires a captured image; and

an arithmetic processing device that measures the surface of the object to be measured by using the captured image,

wherein

the N light sources are arranged so as to make at least incident angles of the line beams adjacent in the width direction on the surface of the object to be measured same,

the N light source are arranged so as to make positions of the reflection regions on the surface of the object to be measured in the moving direction same, and

emission timings of the line beams of the N light sources and image capturing timings are controlled so as to prevent the reflected images from overlapping each other on the screen when capturing the reflected images.

3. A surface measurement apparatus that measures a surface of an object to be measured moving in a predetermined moving direction on a plane or a surface of an object to be measured moving in a predetermined moving direction along a curved surface of a roll, the surface being along the curved surface, the apparatus comprising:

N (N being an integer of two or more) light sources provided in a width direction, the light sources each emitting line beam over the width direction, which is a direction perpendicular to the moving direction;

a screen on which reflected images of N pieces of the line beam reflected on reflection regions of the surface of the object to be measured respectively are projected;

an image capturing device that captures the reflected image projected on the screen and acquires a captured image; and

an arithmetic processing device that measures the surface of the object to be measured by using the captured image,

wherein

the N light sources are arranged so as to make at least incident angles of the line beams adjacent in the width direction on the surface of the object to be measured same,

the N light source are arranged so as to make positions of the reflection regions on the surface of the object to be measured in the moving direction same, and

wavelengths of the line beams that form the reflected images overlapping each other on the screen are different from each other.

4. A surface measurement method that measures a surface of an object to be measured moving in a predetermined moving direction on a plane or a surface of an object to be measured moving in a predetermined moving direction along a curved surface of a roll, the surface being along the curved surface, the method comprising:

from N (N being an integer of two or more) light sources provided in a width direction, which is a direction perpendicular to the moving direction, emitting each line beam over the width direction;

projecting reflected images of N pieces of the line beam reflected on reflection regions of the surface of the object to be measured respectively on a screen;

capturing the reflected image projected on the screen and acquiring a captured image; and

measuring the surface of the object to be measured by using the captured image, wherein

the N light sources are arranged so as to make at least incident angles of the line beams adjacent in the width direction on the surface of the object to be measured same,

the N light source are arranged so as to make positions of the reflection regions on the surface of the object to be measured in the moving direction different, and

the N light sources are arranged so as to make each reflection region that is projected in which the reflection region on the surface of the object to be measured is projected in the moving direction of the object to be measured overlap an adjacent reflection region that is projected in the width direction of the object to be measured.

5. A surface measurement method that measures a surface of an object to be measured moving in a predetermined moving direction on a plane or a surface of an object to be measured moving in a predetermined moving direction along a curved surface of a roll, the surface being along the curved surface, the method comprising:

from N (N being an integer of two or more) light sources provided in a width direction, which is a direction perpendicular to the moving direction, emitting each line beam over the width direction;

projecting reflected images of N pieces of the line beam reflected on reflection regions of the surface of the object to be measured respectively on a screen;

capturing the reflected image projected on the screen and acquiring a captured image; and

measuring the surface of the object to be measured by using the captured image, wherein

the N light sources are arranged so as to make at least incident angles of the line beams adjacent in the width direction on the surface of the object to be measured same,

the N light source are arranged so as to make positions of the reflection regions on the surface of the object to be measured in the moving direction same, and

emission timings of the line beams of the N light sources and image capturing timings are controlled so as to prevent the reflected images from overlapping each other on the screen when capturing the reflected images.

6. A surface measurement method that measures a surface of an object to be measured moving in a predetermined moving direction on a plane or a surface of an object to be measured moving in a predetermined moving direction along a curved surface of a roll, the surface being along the curved surface, the method comprising:

from N (N being an integer of two or more) light sources provided in a width direction, which is a direction perpendicular to the moving direction, emitting each line beam over the width direction;

projecting reflected images of N pieces of the line beam reflected on reflection regions of the surface of the object to be measured respectively on a screen;

capturing the reflected image projected on the screen and acquiring a captured image; and

measuring the surface of the object to be measured by using the captured image, wherein

the N light sources are arranged so as to make at least incident angles of the line beams adjacent in the width direction on the surface of the object to be measured same,

the N light source are arranged so as to make positions of the reflection regions on the surface of the object to be measured in the moving direction same, and

wavelengths of the line beams that form the reflected images overlapping each other on the screen are different from each other.

Assignments (1)

Continuity (1)

References Cited (11)