Three-dimensional image capturing according to time-of-flight measurement and light spot pattern measurement
An electronic device comprising circuitry configured to disambiguate a first phase delay obtained according to an indirect Time-of-Flight principle to obtain a second phase delay, wherein the circuitry is configured to disambiguate the first phase delay based on a captured spot position.
1. An electronic device comprising circuitry configured to disambiguate a first phase delay obtained according to an indirect Time-of-Flight principle to obtain a second phase delay, wherein the circuitry is configured to disambiguate the first phase delay based on a captured spot position.
2. The electronic device of claim 1 , wherein the captured spot position relates to a spot produced by a spot illuminator.
3. The electronic device of claim 1 , wherein the circuitry is configured to determine a spot disparity based on the spot position, and to disambiguate the first phase delay based on the spot disparity.
4. The electronic device of claim 1 , wherein the circuitry is configured to determine the spot disparity based on the spot position and based on a reference position of the spot.
5. The electronic device of claim 4 , wherein the reference position is a predefined expected position.
6. The electronic device of claim 5 , wherein the circuitry is configured to retrieve the predefined expected position from a memory.
7. The electronic device of claim 4 , wherein the circuitry is configured to determine that the first phase delay is outside an unambiguous range if the position of the captured spot is equal to the reference position of the spot.
8. The electronic device of claim 7 , wherein the circuitry is configured to determine the unambiguous phase delay for the spot as identical to the first phase delay if the first phase delay is inside an unambiguous range.
9. The electronic device of claim 1 , wherein the circuitry is configured to determine that the first phase delay is inside an unambiguous range if the position of the captured spot is equal to the reference position of the spot.
10. The electronic device of claim 9 , wherein the circuitry is configured to determine the unambiguous phase delay for the spot as 2π+the first phase delay, if the first phase delay is outside an unambiguous range.
11. The electronic device of claim 1 , wherein the circuitry is configured to determine an unambiguous distance of the spot based on the second phase delay.
12. The electronic device of claim 1 , further comprising an iToF image sensor, wherein the circuitry is configured to determine the first phase delay from a phase image obtained with the iToF image sensor.
13. The electronic device of claim 1 , further comprising the spot illuminator wherein the spot illuminator produces a pattern of light spots, and wherein the circuitry is configured to disambiguate a phase measurement for each spot produced by the spot illuminator.
14. The electronic device of claim 13 , wherein the image analysis performed on the iToF/confidence/amplitude image comprises a local maximum search.
15. A system comprising a spot illuminator, an image sensor and the electronic device of claim 1 , wherein the spot illuminator and the image sensor are spaced apart by a baseline distance, and wherein the spot disparity depends on the baseline distance.
16. The system of claim 15 , wherein the circuitry is configured to determine an object distance estimate based on the spot disparity, based on the baseline distance and based on a modulation frequency, and to disambiguate the first phase delay based on the object distance.
17. The system of claim 15 , wherein an unambiguous range is based on a modulation frequency.
18. A method comprising disambiguating a first phase delay obtained according to an indirect Time-of-Flight principle to obtain a second phase, wherein the disambiguating of the first phase delay is based on a captured spot position.
19. The method of claim 18 , comprising performing a calibration measurement to obtain a reference position, and wherein determining the spot disparity is based on the spot position and the reference position.
20. The method of claim 18 , wherein the reference position of the spot is measured with a baseline distance of approximately zero and/or with the object being far away.