IP Library › Granted Patent US 12,456,023
Granted Patent B1
US 12,456,023 · App. 18/120,875 · Granted Oct 28, 2025

RFID tag location using inventory cycles and illumination adjustment

Inventors: Alberto Pesavento (Seattle, WA); Thomas G. Anderl (Seattle, WA); Robert J. Ascani (Seattle, WA)
Assignee: Impinj, Inc.
G06K7/10099G01S13/758G01S13/82H04B17/318
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Quick Facts
Patent No.
US 12,456,023
App. No.
18/120,875
Granted
Oct 28, 2025
Kind
B1
Abstract

Techniques are provided to estimate the location of an RFID tag using tag read information, such as a tag read count or a tag read rate, and an opportunity metric, such as an inventory cycle duration, inventory cycle rate, or inventory cycle count. A tag tracking system determines read information for a tag in a zone and an opportunity metric associated with the tag and the zone. The tag tracking system then computes a success rate based on the tag read information and opportunity metric, and uses the success rate to estimate the location of the tag.

Claims (73)

1. A method to estimate a location of a Radio Frequency Identification (RFID) integrated circuit (IC) coupled to an antenna, the method comprising:

orienting a first radio-frequency (RF) beam with a first illumination directed to a first target location;

completing a first number of inventory cycles at the first illumination and receiving a plurality of first responses from the RFID IC;

determining a value of a first response rate by performing a computation based on at least the first number of completed inventory cycles and the received first responses;

changing the first illumination to a second illumination directed to the first target location;

completing a second number of inventory cycles at the second illumination and receiving a plurality of second responses from the RFID IC;

determining a value of a second response rate by performing a computation based on at least the second number of completed inventory cycles and the received second responses; and

estimating the RFID IC location with respect to the first target location based on at least the values of the first and second response rates.

2. The method of claim 1 , further comprising estimating the RFID IC location based on excluded locations information.

3. The method of claim 1 , further comprising:

receiving a third response from the RFID IC on another RF beam oriented to a second target location and having a third illumination; and

estimating the RFID IC location based on the third response and the third illumination.

4. The method of claim 3 , wherein estimating the RFID IC location based on the third responses and the third illumination comprises:

determining, based on the third responses, at least one of an RFID IC distance and an RFID IC direction from the second target location; and

estimating the RFID IC location by performing a computation based on at least one of the RFID IC distance and the RFID IC direction.

5. The method of claim 4 , further comprising determining at least one of the RFID IC distance and the RFID IC direction using at least one of:

a received signal strength indicator (RSSI) of the third responses; and

an angle-of-arrival (AoA) of the third responses.

6. The method of claim 1 , further comprising estimating the RFID IC location based on at least one of:

an RSSI of the first responses;

an RSSI of the second responses;

an AoA of the first responses; and

an AoA of the second responses.

7. A method to estimate a location of a Radio Frequency Identification (RFID) integrated circuit (IC) coupled to an antenna, the method comprising:

orienting a first radio-frequency (RF) beam with a first illumination to a first target location;

performing inventorying at the first illumination and in response receiving a plurality of first responses from the RFID IC;

determining a value of a first response rate by performing a computation based on at least a first opportunity metric associated with inventorying at the first illumination and the plurality of the received first responses;

changing the first illumination to a second illumination;

performing inventorying at the second illumination and in response receiving a plurality of second responses from the RFID IC;

determining a value of a second response rate by performing a computation based on at least a second opportunity metric associated with inventorying at the second illumination and the received second responses; and

estimating the RFID IC location with respect to the first target location based on at least the values of the first and second response rates.

8. The method of claim 7 , wherein estimating the RFID IC location comprises:

computing, using at least the values of the first and second response rates, a value of a combined response rate; and

estimating the RFID IC location based on the value of the combined response rate.

9. The method of claim 7 , wherein the first opportunity metric is based on at least one of a time interval and a number of read opportunities.

10. The method of claim 7 , further comprising estimating the RFID IC location based on excluded locations information.

11. The method of claim 7 , further comprising:

receiving a third response from the RFID IC on another RF beam oriented to a second target location and having a third illumination; and

estimating the RFID IC location based on the third response and the third illumination.

12. The method of claim 11 , wherein estimating the RFID IC location further comprises:

determining, based on at least the third response, at least one of:

an RFID IC distance from at least one of the first target location and the second target location; and

an RFID IC direction from at least one of the first target location and the second target location; and

estimating the RFID IC location by performing a computation using at least one of the RFID IC distance and the RFID IC direction.

13. The method of claim 7 , further comprising estimating the RFID IC location using at least one of:

a received signal strength indicator (RSSI) of an RFID IC response; and

an angle-of-arrival (AoA) of the RFID IC response.

14. A Radio Frequency Identification (RFID) system configured to estimate a location of an RFID integrated circuit (IC) coupled to an antenna, the system comprising:

an RFID reader system configured to:

orient a first radio-frequency (RF) beam with a first illumination to a first target location;

perform inventorying at the first illumination and in response receive a plurality of first responses from the RFID IC;

change the first illumination to a second illumination; and

perform inventorying at the second illumination and in response receive a plurality of second responses from the RFID IC; and

a processor coupled to the RFID reader system and configured to:

determine a value of a first response rate by performing a computation based on at least a first opportunity metric associated with inventorying at the first illumination and at least the received first responses;

determine a value of a second response rate by performing a computation based on at least a second opportunity metric associated with inventorying at the second illumination and at least the received second responses; and

estimate the RFID IC location with respect to the first target location based on at least the values of the first and second response rates.

15. The system of claim 14 , wherein the processor is further configured to estimate the RFID IC location by:

determining, using at least the values of the first and second response rates, a value of a combined response rate; and

estimating the RFID IC location based on the value of the combined response rate.

16. The system of claim 14 , wherein the first opportunity metric is based on at least one of a time interval and a number of read opportunities.

17. The system of claim 14 , wherein the processor is further configured to estimate the RFID IC location based on excluded locations information.

18. The system of claim 14 , wherein:

the reader system is further configured to receive a third response from the RFID IC on another RF beam oriented to a second target location and having a third illumination; and

the processor is further configured to estimate the RFID IC location based on the third responses and the third illumination.

19. The system of claim 18 , wherein the processor is further configured to estimate the RFID IC location by:

determining, based on at least the third response, at least one of:

an RFID IC distance from at least one of the first target location and the second target location; and

an RFID IC direction from at least one of the first target location and the second target location; and

estimating the RFID IC location using at least one of the RFID IC distance and the RFID IC direction.

20. The system of claim 14 , wherein the processor is further configured to estimate the RFID IC location using at least one of:

a received signal strength indicator (RSSI) of an RFID IC response; and

an angle-of-arrival (AoA) of the RFID IC response.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 17, 2023
From: PESAVENTO, ALBERTO; ANDERL, THOMAS G.; ASCANI, ROBERT J.
To: IMPINJ, INC.
Reel/Frame 063020/0577 →
Continuity (10)
Continuation In Part 17732623 · Apr 29, 2022
Continuation In Part 17349533 · Jun 16, 2021
Continuation 17113186 · Dec 7, 2020
Continuation 16419253 · May 22, 2019
Continuation 16047029 · Jul 27, 2018
Continuation 16028635 · Jul 6, 2018
Continuation 15818735 · Nov 20, 2017
Continuation 15201231 · Jul 1, 2016
Provisional Application 62529848 · Jul 7, 2017
Provisional Application 62188478 · Jul 2, 2015
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