IP Library Granted Patent US 12,477,247
Granted Patent B2
US 12,477,247 · App. 18/432,385 · Granted Nov 18, 2025

Image sensor

Inventors: Hyunyong Jung (Seoul, KR); Minwoong Seo (Hwaseong-si, KR); Myunglae Chu (Hwaseong-si, KR)
Assignee: Samsung Electronics Co., Ltd.
H04N25/771H04N25/532H04N25/78
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Quick Facts
Patent No.
US 12,477,247
App. No.
18/432,385
Granted
Nov 18, 2025
Kind
B2
Abstract

An image sensor includes a pixel array including a plurality of pixels; and processing circuitry, wherein each of the plurality of pixels includes: a photodiode; a floating diffusion node configured to integrate photocharge generated by the photodiode; a first capacitor configured to store charge corresponding to a voltage of the floating diffusion node which is reset; a first sampling transistor one terminal of which is connected to the second node, and another terminal of which is connected to the first capacitor, being configured to sample charge to the first capacitor; a second capacitor configured to store charge corresponding to the voltage of the floating diffusion node at which the photocharge has been integrated; and a second sampling transistor, one terminal of which is connected to the second node, and another terminal of which is connected to the second capacitor, being configured to sample charge to the second capacitor.

Claims (42)

1 . An image sensor comprising:

a pixel array including a plurality of pixels; and

a row driver connected to the pixel array,

wherein each of the plurality of pixels comprises,

a photodiode;

a transmit transistor connected between the photodiode and a floating diffusion;

a first source follower connected between the floating diffusion and a first node, the first source follower configured to,

amplify a voltage of the floating diffusion, and

output the amplified voltage to the first node;

a first pre-charge select transistor connected to the first node and a second node, the first pre-charge select transistor configured to reset the first node based on a signal from the row driver;

a first capacitor and a second capacitor,

a first sampling transistor connected between the second node and the first capacitor, the first sampling transistor configured to cause the first capacitor to sample the voltage of the floating diffusion; and

a second sampling transistor connected between the second node and the second capacitor, the second sampling transistor configured to cause the second capacitor to sample the voltage of the floating diffusion; and

wherein the row driver is further configured to control each of the plurality of pixels such that the first capacitor and the second capacitor share charge corresponding to the amplified voltage during a first period.

2 . The image sensor of claim 1 ,

wherein the row driver is configured to turn on the first sampling transistor and the second sampling transistor during the first period.

3 . The image sensor of claim 2 , wherein each of the plurality of pixels further comprises:

a second pre-charge select transistor configured to reset the first node.

4 . The image sensor of claim 2 , wherein the row driver is configured to:

turn on the first sampling transistor and turn off the second sampling transistor during a second period.

5 . The image sensor of claim 4 , wherein the row driver is configured to:

turn off the first sampling transistor and turn on the second sampling transistor during a third period.

6 . The image sensor of claim 2 , wherein each of the plurality of pixels further comprises:

a second source follower configured to amplify a voltage of the second node.

7 . The image sensor of claim 1 , wherein

each of the plurality of pixels further comprises a reset transistor configured to reset the floating diffusion; and

the row driver is configured to control each of the plurality of pixels such that the first capacitor stores charge corresponding to the amplified voltage in response to the floating diffusion being reset.

8 . The image sensor of claim 1 , wherein the row driver is configured to:

control each of the plurality of pixels such that the second capacitor stores charges corresponding to the amplified voltage in response to the floating diffusion storing charges received from the photodiode through the transmit transistor.

9 . The image sensor of claim 1 , wherein each of the plurality of pixels further comprises:

a pre-charge transistor configured to pre-charge the first node.

10 . The image sensor of claim 9 , wherein each of the plurality of pixels further comprises:

a second pre-charge select transistor connected between the first node and the pre-charge transistor.

11 . The image sensor of claim 10 , wherein the pre-charge transistor is connected to a ground node.

12 . The image sensor of claim 9 , wherein each of the plurality of pixels further comprises:

a second pre-charge select transistor connected between the pre-charge transistor and a ground node.

13 . The image sensor of claim 12 , wherein the pre-charge transistor is connected between the first node and the second pre-charge select transistor.

14 . The image sensor of claim 3 , wherein the second pre-charge select transistor is further configured to reset the second node.

15 . The image sensor of claim 1 , wherein each of the plurality of pixels further comprises:

a second pre-charge select transistor connected between the first source follower and the first node.

16 . The image sensor of claim 15 , wherein each of the plurality of pixels further comprises:

a pre-charge transistor connected to the first node and a ground node.

Priority Claims (1)
KR 10-2020-0172576 · Dec 10, 2020 · national
Continuity (2)
Division 17482563 · Sep 23, 2021
Related Publication 20240179435A1 · May 30, 2024
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