Impedance tuning of microstrip traces
A printed circuit board comprising a first connection pad coupled to a first portion of a microstrip trace and a second connection pad coupled to a second portion of the microstrip trace. The microstrip trace has a first impedance along the first portion and a second impedance along the second portion. The printed circuit board also includes a conductive plane on a top surface of the microstrip trace, wherein the conductive plane includes a plurality of cutouts to reduce impedance mismatch between the first impedance and the second impedance.
1 . A printed circuit board comprising:
a first connection pad coupled to a first portion of a microstrip trace;
a second connection pad coupled to a second portion of the microstrip trace;
the microstrip trace having a first impedance along the first portion and a second impedance along the second portion; and
a conductive plane on a top surface of the microstrip trace, wherein the conductive plane includes a plurality of cutouts to reduce impedance mismatch between the first impedance and the second impedance.
2 . The printed circuit board of claim 1 , wherein density of the cutouts is greater along the first portion than along the second portion.
3 . The printed circuit board of claim 1 , wherein the first impedance is greater than the second impedance.
4 . The printed circuit board of claim 1 , wherein a high-speed return current or a lower-speed return current can flow through the microstrip trace based on density of the cutouts.
5 . The printed circuit board of claim 1 , wherein a high-speed return current or a lower-speed return current can flow through the microstrip trace based on size of the cutouts.
6 . The printed circuit board of claim 1 , wherein the conductive plane is a conductive silk screen.
7 . The printed circuit board of claim 1 , wherein the microstrip trace has a varying impedance from the first portion to the second portion.
8 . The printed circuit board of claim 7 , wherein the varying impedance is highest at the first portion and lowest at the second portion.
9 . A microstrip trace, comprising:
a first portion having a first impedance;
a second portion having a second impedance; and
a conductive plane shielding the microstrip trace between the first portion and the second portion, wherein the conductive plane includes a plurality of cutouts to reduce impedance mismatch between the first impedance and the second impedance.
10 . The microstrip trace of claim 9 , wherein the first portion is physically coupled to a first connection pad.
11 . The microstrip trace of claim 9 , wherein the second portion is physically coupled to a second connection pad.
12 . The microstrip trace of claim 9 , wherein the conductive plane is a conductive silk screen.
13 . The microstrip trace of claim 9 , wherein the first impedance is not equal to the second impedance.
14 . The microstrip trace of claim 9 , wherein density of the cutouts is greater along the first portion than along the second portion.
15 . The microstrip trace of claim 9 , wherein impedance is greater along the first portion than along the second portion.
16 . An information handling system comprising:
a printed circuit board comprising:
a first connection pad coupled to a first portion of a microstrip trace;
a second connection pad coupled to a second portion of the microstrip trace;
the microstrip trace having a first impedance along the first portion and a second impedance along the second portion; and
a conductive plane that includes at least one cutout to reduce impedance mismatch between the first impedance and the second impedance.
17 . The information handling system of claim 16 , wherein the conductive plane is a conductive silk screen.
18 . The information handling system of claim 16 , wherein an impedance measurement is different around the first connection pad and the second connection pad.
19 . The information handling system of claim 16 , wherein the first connection pad is physically coupled with a first electronic component with an impedance requirement that is different than a second electronic component that is physically coupled to the second connection pad.
20 . The information handling system of claim 16 , wherein density of cutouts is different along the first connection pad than the second connection pad.