Granted Patent B2

US 12,507,976 · App. 18/465,144 · Granted Dec 30, 2025

Inventors: Hua Li (Shanghai, CN); Jiawen Zhou (Shanghai, CN); Yifeng Jiang (Shanghai, CN); Tao He (Shanghai, CN); Yong Yang (Shanghai, CN)

Assignee: SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD.

A61B6/582A61B6/032H05G1/265H05G1/34

Abstract

Claims (60)

1 . A method for preheating a filament of an X-ray tube, comprising:

obtaining a first emission plan and a second emission plan;

determining, based on a time interval between the first emission plan and the second emission plan, a filament temperature;

determining, based on the filament temperature and at least one of a value of a tube voltage, a value of the tube current, a time length for performing a filament preheating plan corresponding to the second emission plan, the filament preheating plan corresponding to the second emission plan, wherein the time length is determined based on a difference between a value of the tube current of the first emission plan and the value of the tube current of the second emission plan; and

performing, based on the filament preheating plan, a filament-preheating operation.

2 . The method of claim 1 , wherein the determining, based on a time interval between the first emission plan and the second emission plan, the filament temperature includes:

determining a value of a tube voltage of the first emission plan and a value of a tube current of the first emission plan; and

determining, based on the value of the tube voltage of the first emission plan, the value of the tube current of the first emission plan, and the time interval, the filament temperature.

3 . The method of claim 2 , wherein determining, based on the value of the tube voltage of the first emission plan, the value of the tube current of the first emission plan, and the time interval, the filament temperature includes:

determining, based on the end time for the first emission plan, and the start time for the second emission plan, the time interval between the first emission plan and the second emission plan;

obtaining a filament temperature model; and

determining, based on the value of the tube voltage of the first emission plan, the value of the tube current of the first emission plan, and the time interval, the filament temperature using the filament temperature model.

4 . The method of claim 3 , wherein the filament temperature model includes a corresponding relationship between the filament temperature and a time interval at a value of the tube voltage and a value of the tube current of the first emission plan.

5 . The method of claim 1 , wherein the determining, based on the filament temperature and at least one of the value of the tube voltage, the value of the tube current, or the time length, a filament preheating plan corresponding to the second emission plan, includes:

obtaining a heating model; and

generating the filament preheating plan based on the filament temperature and at least one of the value of the tube voltage, the value of the tube current, or the time length for performing the filament preheating plan using the heating model.

6 . The method of claim 5 , wherein the heating model includes a corresponding relationship of the time length, the tube voltage, the filament temperature, and the tube current.

7 . The method of claim 5 , wherein the time length for performing the filament preheating plan is determined based on a start time for performing the second emission plan and a start time for performing the filament preheating plan.

8 . The method of claim 5 , wherein the time length for performing the filament preheating plan is determined according to operations including:

determining a difference between a value of the tube current of the first emission plan and the value of the tube current of the second emission plan; and

determining the time length based on the difference and a heating model, wherein the heating model includes a corresponding relationship of the difference, and the time length.

9 . The method of claim 5 , wherein the generating, based on the filament temperature and at least one of the value of the tube voltage, the value of the tube current, or the time length, the filament preheating plan includes:

determining whether the time interval is smaller than the time length; and

in response to determining that the time interval is not smaller than the time length, generating the filament preheating plan based on the filament temperature, the value of the tube voltage, the value of the tube current, a difference between a value of the tube current of the first emission plan and the value of the tube current of the second emission plan using the heating model.

10 . The method of claim 5 , wherein the generating, based on the filament temperature and at least one of the value of the tube voltage, the value of the tube current, or the time length, the filament preheating plan includes:

determining whether the time interval is smaller than the time length; and

in response to determining that the time interval is smaller than the time length of preheating, reporting an error.

11 . The method of claim 1 , wherein the filament temperature includes an initial value or equivalent description value at a time when the filament preheating plan corresponding to the second emission plan is performed or when the second emission plan is performed.

12 . The method of claim 1 , wherein the generating, based on the filament temperature and at least one of the value of the tube voltage, the value of the tube current, or the time length, the filament preheating plan includes:

determining whether the time interval is smaller than the time length; and

in response to determining that the time interval is not smaller than the time length, generating the filament preheating plan based on the filament temperature, the value of the tube voltage, the value of the tube current, a difference between a value of the tube current of the first emission plan and the value of the tube current of the second emission plan.

13 . A system for preheating a filament of an X-ray tube, comprising:

a storage device storing a set of instructions; and

one or more processors configured to communicate with the storage device, wherein when executing the set of instructions, the one or more processors are configured to cause the system to perform operations including:

obtaining a first emission plan and a second emission plan;

determining, based on a time interval between the first emission plan and the second emission plan, a filament temperature;

determining, based on the filament temperature and at least one of a value of a tube voltage, a value of the tube current, a time length for performing a filament preheating plan corresponding to the second emission plan, the filament preheating plan corresponding to the second emission plan, wherein the time length is determined based on a difference between a value of the tube current of the first emission plan and the value of the tube current of the second emission plan; and

performing, based on the filament preheating plan, a filament-preheating operation.

14 . The system of claim 13 , wherein the determining, based on a time interval between the first emission plan and the second emission plan, the filament temperature includes:

determining a value of a tube voltage of the first emission plan and a value of a tube current of the first emission plan; and

determining, based on the value of the tube voltage of the first emission plan, the value of the tube current of the first emission plan, and the time interval, the filament temperature.

15 . The system of claim 14 , wherein determining, based on the value of the tube voltage of the first emission plan, the value of the tube current of the first emission plan, and the time interval, the filament temperature includes:

determining, based on the end time for the first emission plan, and the start time for the second emission plan, the time interval between the first emission plan and the second emission plan;

obtaining a filament temperature model; and

determining, based on the value of the tube voltage of the first emission plan, the value of the tube current of the first emission plan, and the time interval, the filament temperature using the filament temperature model.

16 . The system of claim 13 , wherein the determining, based on the filament temperature and at least one of the value of the tube voltage, the value of the tube current, or the time length, a filament preheating plan corresponding to the second emission plan, includes:

obtaining a heating model; and

generating the filament preheating plan based on the filament temperature and at least one of the value of the tube voltage, the value of the tube current, or the time length for performing the filament preheating plan using the heating model.

17 . The system of claim 16 , wherein the time length for performing the filament preheating plan is determined according to operations including:

determining a difference between a value of the tube current of the first emission plan and the value of the tube current of the second emission plan; and

determining the time length based on the difference and a heating model, wherein the heating model includes a corresponding relationship of the difference, and the time length.

18 . The system of claim 16 , wherein the generating, based on the filament temperature and at least one of the value of the tube voltage, the value of the tube current, or the time length, the filament preheating plan includes:

determining whether the time interval is smaller than the time length;

in response to determining that the time interval is not smaller than the time length, generating the filament preheating plan based on the filament temperature, the value of the tube voltage, the value of the tube current, a difference between a value of the tube current of the first emission plan and the value of the tube current of the second emission plan using the heating model; or

in response to determining that the time interval is not smaller than the time length of preheating, reporting an error.

19 . A non-transitory computer readable medium including executable instructions that, when executed by at least one processor, cause the at least one processor to effectuate a method comprising:

obtaining a first emission plan and a second emission plan;

determining, based on a time interval between the first emission plan and the second emission plan, a filament temperature;

determining, based on the filament temperature and at least one of a value of a tube voltage, a value of the tube current, a time length for performing a filament preheating plan corresponding to the second emission plan, the filament preheating plan corresponding to the second emission plan, wherein the time length is determined based on a difference between a value of the tube current of the first emission plan and the value of the tube current of the second emission plan; and

performing, based on the filament preheating plan, a filament-preheating operation.

Assignments (1)

Priority Claims (1)

Continuity (4)

References Cited (30)