IP Library Granted Patent US 12,596,083
Granted Patent B2
US 12,596,083 · App. 18/018,293 · Granted Apr 7, 2026

Automated analyzer

Inventor: Kohji Okada (Kyoto, JP)
Assignee: SHIMADZU CORPORATION
G01N23/2204G01N23/223G01N35/00584G01N35/0099G01N35/04G01N2035/041G01N2035/0462G01N2223/076G01N2223/1016G01N2223/306
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,596,083
App. No.
18/018,293
Granted
Apr 7, 2026
Kind
B2
Abstract

An automated analyzer includes: a measurement device; at least one sample tray on which a plurality of sample containers is placed; a conveyance device configured to select one of the plurality of sample containers placed on the sample tray, convey the selected sample container to the measurement device, and return the sample container to an original sample tray on which the sample container was originally placed after measurement by the measurement device; a control device for controlling an operation of the conveyance device; and a retreat portion provided at a position different from positions where the measurement device and the sample tray are provided, the retreat portion being configured to temporarily place the sample container. The control device causes the sample container to retreat to the retreat portion in a case where the sample container cannot be returned from the measurement device to the sample tray.

Claims (48)

1 . An automated analyzer for analyzing a sample, comprising:

a measurement device configured to measure the sample;

at least one sample tray provided outside the measurement device, the at least one sample tray being configured to receive a plurality of sample containers thereon;

a conveyance device configured to select one of the plurality of sample containers placed on the sample tray, convey the selected sample container to the measurement device, and after measurement by the measurement device, return the sample container to an original sample tray on which the sample container was originally placed;

a control device configured to control an operation of the conveyance device; and

a retreat portion provided at a position different from positions where the measurement device and the sample tray are provided, the retreat portion being configured to temporarily receive the sample container,

wherein the control device causes the conveyance device to place the sample container at the retreat portion when the sample container is unable to be returned from the measurement device to the original sample tray, and

wherein the automated analyzer is a fluorescence X-ray analyzer configured to analyze the sample by irradiating a surface of the sample with X-rays and detecting fluorescence X-rays generated from the surface.

2 . The automated analyzer as recited in claim 1 , further comprising:

a rack configured to set the sample tray; and

a first sensor configured to detect that the sample tray is set to the rack,

wherein the control device determines that the sample container is unable to be returned from the measurement device to the original sample tray when the first sensor is unable to detect that the sample tray is set to the rack.

3 . The automated analyzer as recited in claim 2 ,

wherein the conveyance device is provided with a gripping portion for gripping the sample container,

wherein the conveyance device conveys the sample container with the sample container gripped by the gripping portion, and

wherein the control device

causes the conveyance device to perform an operation to grip a different sample container at a position where the sample container after the measurement is to be returned after the first sensor detects that the sample tray is set to the rack,

determines whether the different sample container is placed at the position where the sample container after the measurement is to be returned, based on a status of the gripping portion, and

determines that the sample container is unable to be returned from the measurement device to the original sample tray when the different sample container is placed at the position where the sample container after the measurement is to be returned.

4 . The automated analyzer as recited in claim 3 , wherein the status of the gripping portion is based on:

if the gripping portion is spread outwardly, then the control device determines that the different sample container is at the position where the sample container is to be returned; and

if the gripping portion is not spread outwardly, then the control device determines that the position where the sample container is to be returned is not occupied.

5 . The automated analyzer as recited in claim 4 , wherein when the gripping portion is spread outwardly and the control device determines that the different sample container is at the position where the sample container is to be returned, the gripping portion is gripping the different sample container such that the different sample container causes the gripping portion to spread outwardly.

6 . The automated analyzer as recited in claim 2 , further comprising:

a second sensor configured to detect whether the sample container is placed on the sample tray,

wherein the control device

determines whether a different sample container is placed at the position where the sample container after the measurement is to be returned, based on a detection result of the second sensor when the first sensor detects that the sample tray is set to the rack, and

determines that the sample container is unable to be returned from the measurement device to the original sample tray when the different sample container is placed at the position where the sample container after the measurement is to be returned.

7 . The automated analyzer as recited in claim 2 , wherein the rack supports a plurality of sample trays.

8 . The automated analyzer as recited in claim 1 , further comprising:

a notification unit configured to notify that the sample container has retreated to the retreat portion when the sample container has retreated to the retreat portion,

wherein the control device

determines whether the sample container is able to be returned from the retreat portion to the original sample tray after a notification by the notification unit, and returns the sample container to the original sample tray when the sample container is able to be returned to the original sample tray.

9 . The automated analyzer as recited in claim 1 ,

wherein the measurement device is covered with a housing and an opening/closing lid to form a sealed space therein.

10 . An automated analyzer for analyzing a sample, comprising:

a measurement device configured to measure the sample;

at least one sample tray provided outside the measurement device, the at least one sample tray being configured to receive a plurality of sample containers thereon;

a rack configured to set the sample tray, wherein when the sample tray is set on the rack, the sample tray remains at a fixed position on the rack relative to the measurement device;

a conveyance device configured to select one of the plurality of sample containers placed on the sample tray, convey the selected sample container to the measurement device, and after measurement by the measurement device, return the sample container to an original sample tray on which the sample container was originally placed;

a control device configured to control an operation of the conveyance device; and

a retreat portion provided at a position different from positions where the measurement device and the sample tray are provided, the retreat portion being configured to temporarily receive the sample container,

wherein the control device causes the conveyance device to place the sample container at the retreat portion when the sample container is unable to be returned from the measurement device to the original sample tray, and

wherein the automated analyzer is a fluorescence X-ray analyzer configured to analyze the sample by irradiating a surface of the sample with X-rays and detecting fluorescence X-rays generated from the surface.

11 . The automated analyzer as recited in claim 10 , wherein the sample tray remains at the same fixed position on the rack relative to the measurement device prior to removal of the sample container from the sample tray and during the measurement of the sample by the measurement device.

12 . The automated analyzer as recited in claim 10 , wherein the rack supports a plurality of sample trays.

13 . The automated analyzer as recited in claim 10 , further comprising a first sensor configured to detect that the sample tray is set to the rack and configured to detect an identifier of the sample tray.

14 . The automated analyzer as recited in claim 10 , wherein the sample container is at an original position on the original sample tray when the conveyance device selects the sample container and conveys the sample container to the measurement device, and wherein, after measurement by the measurement device, the control device causes the conveyance device to place the sample container at either the original position on the original sample tray or the retreat portion.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 13, 2023
From: OKADA, KOHJI
To: SHIMADZU CORPORATION
Reel/Frame 064573/0423 →
Priority Claims (1)
JP 2020-128042 · Jul 29, 2020 · national
Continuity (1)
Related Publication 20240027375A1 · Jan 25, 2024
References Cited (37)
US 5257302A · Narukawa · 1993 [cited by examiner]
US 5876670A · Mitsumaki · 1999 [cited by examiner]
US 6438200B1 · Kita · 2002 [cited by examiner]
US 6700951B2 · Sumii · 2004 [cited by examiner]
US 7842237B1 · Shibuya et al. · 2010 [cited by applicant]
US 8343772B2 · Tanaka · 2013 [cited by examiner]
US 8701508B2 · Hamada · 2014 [cited by examiner]
US 9134331B2 · Hamada · 2015 [cited by examiner]
US 10094844B2 · Saito · 2018 [cited by examiner]
US 10234364B2 · Nagai · 2019 [cited by examiner]
US 11680951B2 · Oda · 2023 [cited by examiner]
US 20020186812A1 · Sumii · 2002 [cited by applicant]
US 20090223311A1 · Hamada · 2009 [cited by examiner]
US 20090227033A1 · Hamada · 2009 [cited by examiner]
US 20120148447A1 · Tanaka · 2012 [cited by examiner]
US 20140170023A1 · Saito · 2014 [cited by examiner]
US 20150185120A1 · Nagai · 2015 [cited by examiner]
US 20200072860A1 · Oda · 2020 [cited by examiner]
US 20240027375A1 · Okada · 2024 [cited by examiner]
US 20250067690A1 · Suzuki · 2025 [cited by examiner]
CN 109100523A · 2018 [cited by applicant]
JP S63236966A · 1988 [cited by applicant]
JP H026261U · 1990 [cited by applicant]
JP H04102047U · 1992 [cited by applicant]
JP 2003057197A · 2003 [cited by applicant]
JP 2005207908A · 2005 [cited by applicant]
JP 2009198405A · 2009 [cited by applicant]
JP 2009198406A · 2009 [cited by examiner]
JP 2010197048A · 2010 [cited by applicant]
JP 2010271075A · 2010 [cited by applicant]
JP 2015096833A · 2015 [cited by applicant]
WO 2001051929A1 · 2001 [cited by applicant]
WO 2020044399A1 · 2020 [cited by applicant]
English translation of JP 2009-198405 A, cited in the IDS filed Jan. 27, 2023 (Year: 2009). [cited by examiner]
PCT Written Opinion of the International Searching Authority (Form PCT/ISA/237) for PCT application No. PCT/JP2021/018795, dated Aug. 10, 2021. [cited by applicant]
Office Action dated Jan. 9, 2024 for corresponding Japanese patent application No. JP 2002-540029. [cited by applicant]
Office Action dated Dec. 10, 2025 for corresponding application No. CN 202180066220.2. [cited by applicant]