Two-photon microscopy and pulse width correction method using the same
View Patent ↗Provided is a two-photon spectroscopy including a light source configured to generate first laser light having a pulse, a pulse width correction device configured to receive the first laser light to output a second laser light, an optical system through which the second laser light passes, a first two-photon sensor configured to measure a first pulse width of the first laser light generated from the light source, and a second two-photon sensor configured to measure a second pulse width of the second laser light passing through the optical system, wherein the pulse width correction device corrects a difference between the first pulse width and the second pulse width.
1 . A two-photon spectroscopy, comprising:
a light source configured to generate first laser light having a pulse;
a pulse width correction device configured to receive the first laser light to output a second laser light;
an optical system through which the second laser light passes;
a first two-photon sensor configured to measure a first pulse width of the first laser light generated from the light source;
a data reception unit; and
a second two-photon sensor configured to measure a second pulse width of the second laser light passing through the optical system,
wherein the pulse width correction device is configured to decrease a difference between the first pulse width and the second pulse width,
wherein the first two-photon sensor and the second two-photon sensor are connected to the data reception unit,
wherein the first pulse width and the second pulse width are delivered to the data reception unit,
wherein the data reception unit is configured to calculate the difference between the first pulse width and the second pulse width, and
wherein the measuring of the first pulse width, the measuring of the second pulse width, and the decreasing of the difference between the first pulse width and the second pulse width is repeatedly performed by the pulse width correction device.
2 . The two-photon spectroscopy of claim 1 , wherein the first laser light generated by the light source has a wavelength of a near-infrared region.
3 . The two-photon spectroscopy of claim 1 , wherein the first laser light generated by the light source has a pulse width of femtoseconds.
4 . The two-photon spectroscopy of claim 1 , wherein the pulse width correction device includes a half-wave plate and a polarizer.
5 . The two-photon spectroscopy of claim 1 , wherein the pulse width correction device includes a chirped reflection mirror.
6 . The two-photon spectroscopy of claim 1 , wherein the pulse width correction device includes a pair of prisms.
7 . The two-photon spectroscopy of claim 1 , wherein the pulse width correction device includes a pair of diffraction gratings.
8 . The two-photon spectroscopy of claim 1 , wherein the pulse width correction device includes a pair of grisms.
9 . The two-photon spectroscopy of claim 1 , wherein the pulse width correction device is disposed between the light source and the optical system, and outputs the second laser light having the second pulse width obtained by adding a negative dispersion value to the first pulse width.
10 . The two-photon spectroscopy of claim 1 , further comprising:
a sample part to which the second laser light is delivered from the optical system; and
a third two-photon sensor configured to measure a third pulse width of detection light emitted from the sample part to pass through the optical system,
wherein the pulse width correction device further decreases a difference between the first pulse width and the third pulse width.
11 . The two-photon spectroscopy of claim 10 ,
wherein the optical system includes a first optical system, a second optical system, and a third optical system,
wherein the second laser light passes through the first optical system and the second optical system, and
the detection light passes through the second optical system and the third optical system.
12 . The two-photon spectroscopy of claim 1 , further including:
an interference system between the light source and the first two-photon sensor to deliver a portion of the first laser light generated by the light source to the first two-photon sensor.
13 . A two-photon spectroscopy, comprising:
a light source configured to generate first laser light having a pulse;
an interference system configured to receive the first laser light to output second and third beams of laser light;
a first two-photon sensor configured to measure a first pulse width of the second laser light;
a pulse width correction device configured to receive the third laser light to output a fourth laser light;
an optical system configured to receive the fourth laser light to output fifth laser light;
a data reception unit; and
a second two-photon sensor configured to measure a second pulse width of the fifth laser light,
wherein the pulse width correction device decreases a difference between the first pulse width and the second pulse width,
wherein the first two-photon sensor and the second two-photon sensor are connected to the data reception unit,
wherein the first pulse width and the second pulse width are delivered to the data reception unit,
wherein the data reception unit is configured to calculate the difference between the first pulse width and the second pulse width, and
wherein the measuring of the first pulse width, the measuring of the second pulse width, and the decreasing of the difference between the first pulse width and the second pulse width is repeatedly performed by the pulse width correction device.
14 . The two-photon spectroscopy of claim 13 , wherein the pulse width correction device outputs corrected fourth laser light having a second pulse width obtained by adding a negative dispersion value to a pulse width of the third laser light.
15 . The two-photon spectroscopy of claim 13 , further including:
a sample part to which sixth laser light emitted from the optical system is delivered; and
a third two-photon sensor configured to measure a third pulse width of detection light emitted from the sample part to pass through the optical system,
wherein the pulse width correction device further corrects a difference between the first pulse width and the third pulse width.
16 . The two-photon spectroscopy of claim 15 ,
wherein the optical system includes a first optical system, a second optical system, and a third optical system,
wherein the fourth laser light passes through the first optical system and the second optical system, and
the detection light passes through the second optical system and the third optical system.
17 . A pulse width correction method, comprising:
measuring, by a first two-photon sensor, a first pulse width of a first laser light output from a light source;
measuring, by a second two-photon sensor, a second pulse width of a second laser light output from optical system when the first laser light passes through the optical system;
calculating, by a data reception unit, a difference between the first pulse width and the second pulse width; and
decreasing, by a pulse width correction device, the difference between the first pulse width and the second pulse width based on a negative dispersion value corresponding to the difference between the first pulse width and the second pulse width,
wherein the first two-photon sensor and the second two-photon sensor are connected to the data reception unit,
wherein the first pulse width and the second pulse width are delivered to the data reception unit, and
wherein the measuring of the first pulse width, the measuring of the second pulse width, and the decreasing of the difference between the first pulse width and the second pulse width is repeatedly performed by the pulse width correction device.
18 . The pulse width correction method of claim 17 , wherein the calculating and decreasing are repeatedly performed.
19 . The pulse width correction method of claim 17 , wherein the second pulse width, prior to the decreasing of the difference between the first pulse width and the second pulse width, has a difference corresponding to a positive dispersion value in comparison to the first pulse width.
20 . The pulse width correction method of claim 17 , further comprising:
delivering the second laser light from the optical system to a sample part;
measuring a third pulse width of detection light emitted from the sample part to pass through the optical system;
calculating a difference between the first pulse width and the third pulse width; and
decreasing the difference between the first pulse width and the third pulse width.