IP Library › Granted Patent US 12,700,079
Granted Patent B2
US 12,700,079 · App. 18/321,527 · Granted Aug 4, 2026

Cross-scale defect detection method based on deep learning

Inventors: Jun Wang (Nanjing, CN); Zhongde Shan (Nanjing, CN); Li Dai (Nanjing, CN); Dawei Li (Nanjing, CN)
Assignee: Nanjing University of Aeronautics and Astronautics
G06T7/0004G06V10/7715G06V10/806G06V20/70G06T2207/10028G06T2207/20081G06T2207/30108
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,700,079
App. No.
18/321,527
Filed
May 22, 2023
Granted
Aug 4, 2026
Kind
B2
Art Unit
2667
USPC
382/159
Abstract

A cross-scale defect detection method based on deep learning, including: (S 1 ) building a vision data acquisition system to acquire a surface image of a part to be processed; and building a defect dataset; (S 2 ) building a deep learning-based cross-scale defect detection model; and inputting the defect dataset obtained in the step (S 1 ) into the deep learning-based cross-scale defect detection model for model training; and (S 3 ) building a defect detection system according to the deep learning-based cross-scale defect detection model and the vision data acquisition system; and detecting a defect of the surface image of the part to be processed.

Claims (78)

1 . A cross-scale defect detection method based on deep learning, comprising:

(S 1 ) building a vision data acquisition system to acquire a depth image and a visible image of a defect of a surface image of a part to be processed; and constructing a defect dataset;

(S 2 ) building a deep learning-based cross-scale defect detection model; and inputting the defect dataset constructed in step (S 1 ) into the deep learning-based cross-scale defect detection model for model training; and

(S 3 ) building a defect detection system according to the deep learning-based cross-scale defect detection model and the vision data acquisition system; and detecting, by the defect detection system, the defect of the surface image of the part to be processed;

wherein in step (S 2 ), the deep learning-based cross-scale defect detection model is operated through steps of:

(a) taking a defect data group comprising the depth image and the visible image as an input;

(b) extracting a feature of the depth image and a feature of the visible image by means of a bi-branch feature extraction network; and subjecting the feature of the depth image and the feature of the visible image respectively extracted by two branches of the bi-branch feature extraction network to weighted fusion through an attention mechanism; and

(c) subjecting the feature of the depth image and the feature of the visible image after weighted fusion to cross-scale feature fusion to reduce a channel dimension of a feature map F A2 of a first scale, a channel dimension of a feature map F A3 of a second scale, a channel dimension of a feature map F A4 of a third scale, a channel dimension of a feature map F A5 of a fourth scale and a channel dimension of a feature map F A6 acquired by a squeeze-and-excitation (SE) module from 256 to 64; and obtaining intermediate feature maps F B2 , F B3 , F B4 , F B5 and F B6 by using a 1×1 convolution;

performing up-sampling and/or down-sampling on the F B2 , F B3 , F B4 and F B5 followed by concatenating to obtain a 256-D feature map having the same spatial resolution with a corresponding scale; and

concatenating the F A4 with the 256-D feature map to achieve a cross-scale feature fusion of five scales, expressed as:

f

=

∑

n

N

⁢

sum

⁡

(

∑

i

∈

W

,

j

∈

H

⁢

F

n

(

x

i

,

y

j

)

)

+

F

A

⁢

4

;

wherein (x, y) is a pixel point of F n ; sum indicates summation; N is the number of feature maps; W is an image width; and H is an image height.

2 . The cross-scale defect detection method of claim 1 , wherein step (S 1 ) comprises:

(S 11 ) acquiring, by a depth sensor, the depth image of the defect of the surface image of the part to be processed, and acquiring, by a vision sensor, the visible image of the defect of the surface image of the part to be processed, wherein the depth image of the defect and the visible image of the defect are constructed as a defect data group;

(S 12 ) rotating, cutting, scaling and converting the depth image and the visible image acquired in step (S 11 ) to increase data of the surface image of the part to be processed for training; and

(S 13 ) annotating the defect of the surface image of the part to be processed by means of LabelImg to obtain the defect dataset.

3 . The cross-scale defect detection method of claim 1 , wherein each of the two branches of the bi-branch feature extraction network comprises a mix convolution branch and a squeeze-and-excitation (SE) branch;

wherein the mix convolution branch is configured to fuse multi-scale local information by using different receptive fields according to a convolution kernel size and a group size;

the SE branch is configured to distinguish a significance between different feature layers, and deepen semantic extraction and decoding through residual skip connection;

the group size G determines the number of different types of convolution kernels for a single input tensor; and

when G=1, mix convolution is equivalent to a normal depth convolution.

4 . The cross-scale defect detection method of claim 1 , wherein a fusion equation of the attention mechanism is expressed as:

F

=

∑

i

N

⁢

λ

1

⁢

F

di

+

λ

2

⁢

F

vi

;

wherein λ 1 is a weight of the feature of the depth image; λ 2 is a weight of the feature of the visible image; N is the number of layers of a feature map; F di is an i th -layer feature map of the depth image; and F vi is an i th -layer feature map of the visible image.

5 . The cross-scale defect detection method of claim 1 , wherein the step (S 3 ) comprises:

building the defect detection system according to the deep learning-based cross-scale defect detection model and the vision data acquisition system; and

outputting, by the defect detection system, defect detection results in real time and saving the defect detection results in a form comprising a defect image and a table comprising a defect location;

wherein the vision data acquisition system is configured to acquire data; and the deep learning-based cross-scale defect detection model is configured for defect detection and detection result output.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 29, 2026
From: WANG, JUN; SHAN, ZHONGDE; DAI, LI; LI, DAWEI
To: NANJING UNIVERSITY OF AERONAUTICS AND ASTRONAUTICS
Reel/Frame 075125/0988 →
Priority Claims (1)
CN 202210571824.9 · May 25, 2022 · national
Continuity (1)
Related Publication 20230306577A1 · Sep 28, 2023
References Cited (36)
US 11457138B2 · Huang · 2022 [cited by examiner]
US 11514660B1 · Yang · 2022 [cited by examiner]
US 12260630B2 · Goyal · 2025 [cited by examiner]
US 20200412940A1 · Huang · 2020 [cited by examiner]
US 20210174513A1 · Chidlovskii · 2021 [cited by examiner]
US 20220067950A1 · Lv · 2022 [cited by examiner]
US 20220253639A1 · Fan · 2022 [cited by examiner]
CN 103295016A · 2013 [cited by examiner]
CN 108460403A · 2018 [cited by examiner]
CN 108921846A · 2018 [cited by applicant]
CN 111415329A · 2020 [cited by examiner]
CN 111507998A · 2020 [cited by examiner]
CN 112434576A · 2021 [cited by examiner]
CN 113128559A · 2021 [cited by applicant]
CN 113393434A · 2021 [cited by examiner]
CN 113947590A · 2022 [cited by examiner]
CN 114078204A · 2022 [cited by examiner]
CN 114170174A · 2022 [cited by applicant]
CN 114266964A · 2022 [cited by applicant]
CN 114332559A · 2022 [cited by applicant]
CN 115471718A · 2022 [cited by examiner]
CN 119693794A · 2025 [cited by examiner]
CN 120339590A · 2025 [cited by examiner]
WO WO2021088300A1 · 2021 [cited by examiner]
P. Lu, J. Jing and Y. Huang, “MRD-Net: An Effective CNN-Based Segmentation Network for Surface Defect Detection,” in IEEE Transactions on Instrumentation and Measurement, vol. 71, pp. 1-12, 2022, Art No. 2516812, doi: 1… [cited by examiner]
D. P. Fan, Z. Lin, Z. Zhang, M. Zhu, andM. M. Cheng, “RethinkingRGB-D salient object detection: Models, data sets, and large-scale benchmarks,” IEEE Trans. Neural Netw. Learn. Syst., vol. 32, No. 5, pp. 2075-2089, May 2… [cited by examiner]
Shorten, Connor, and Taghi M. Khoshgoftaar. “A survey on image data augmentation for deep learning.” Journal of big data 6.1 (2019): 1-48. (Year: 2019). [cited by examiner]
Chen, Hao, Youfu Li, and Dan Su. “Multi-modal fusion network with multi-scale multi-path and cross-modal interactions for RGB-D salient object detection.” Pattern Recognition 86 (2019): 376-385. (Year: 2019). [cited by examiner]
J. Wang, K. Song, D. Zhang, M. Niu and Y. Yan, “Collaborative Learning Attention Network Based on RGB Image and Depth Image for Surface Defect Inspection of No-Service Rail,” in IEEE/ASME Transactions on Mechatronics, v… [cited by examiner]
Q. Zou, Z. Zhang, Q. Li, X. Qi, Q. Wang and S. Wang, “DeepCrack: Learning Hierarchical Convolutional Features for Crack Detection,” in IEEE Transactions on Image Processing, vol. 28, No. 3, pp. 1498-1512, Mar. 2019, doi… [cited by examiner]
Jie Hu, Li Shen, Gang Sun; Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2018, pp. 7132-7141 (Year: 2018). [cited by examiner]
Gong Cheng et al., “Cross-Scale Feature Fusion for Object Detection in Optical Remote Sensing Images”, IEEE Geoscience and Remote Sensing Letters, Mar. 4, 2020, Section II, pp. 1-5. [cited by applicant]
Jingpeng Wang et al., “Collaborative Learning Attention Network Based on RGB Image and Depth Image for Surface Defect Inspection of No-Service Rail”, IEEE/ASME Transactions on Mechatronics, Dec. 2022, VOI.27, No. 6, pp.… [cited by applicant]
You Wu et al., “Automatic Fabric Defect Detection Using Cascaded Mixed Feature Pyramid with Guided Localization”, sensors, 2020, vol. 20, No. 3, Section 3, pp. 1-17. [cited by applicant]
Hao Shuai et al., “YOLOv5 Transmission Line Fault Detection Based on Attention Mechanism and Cross-scale Feature Fusion”, Proceedings of the Chinese Society for Electrical Engineering, Mar. 20, 2023, vol. 43, No. 6, pp.… [cited by applicant]
Zhiyuan Wu et al., “Research on Surface Defect Detection of notebook Panel based on RGB-D data”, Equipment Manufacturing Technology, 2022, No. 2, pp. 21-24, 35. [cited by applicant]