IP Library › Granted Patent US 12,706,761
Granted Patent B2
US 12,706,761 · App. 18/792,303 · Granted Aug 11, 2026

Adaptive control system of a configurable strong PUF source

Inventors: Sylvain Guilley (Paris, FR); Florent Lozac'h (Servon-sur-Vilaine, FR)
Assignee: SECURE-IC SAS
H04L9/3278H04L9/0891
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Quick Facts
Patent No.
US 12,706,761
App. No.
18/792,303
Filed
Aug 1, 2024
Granted
Aug 11, 2026
Kind
B2
Art Unit
2431
USPC
380/277
Abstract

An adaptive control system of a configurable strong PUF source configured to deliver a self-enrollment status, a key (K) and a key rebuilding status, including an adaptive PUF control unit configured to: receive information of entropy of at least one key, reliability of the at least one key and PUF index representative of one of the at least one key; challenge and configure the strong PUF source; and receive a quantized non-binary response in feedback of the strong PUF source; a PUF control logic finite state machine configured to drive the adaptive control unit, configured to: receive a PUF mode operation to execute, first self-enrollment, then key rebuilding; access to data representative of one-time programmable policy; write and read data of a data RAM; write and read a one-time programmable data.

Claims (32)

1 . An adaptive control system of a configurable strong PUF source (CSPS) configured to deliver a self-enrollment status (SE_S), a key (K) and a key rebuilding status (KR_S), comprising:

an adaptive PUF control unit (ACU) configured to:

receive information of entropy of at least one key, reliability of the at least one key and PUF index representative of one of the at least one key;

challenge and configure the strong PUF source (CSPS); and

receive a quantized non-binary response in feedback of the strong PUF source (CSPS);

a PUF control logic finite state machine (CFSM) configured to drive the adaptive control unit (ACU), configured to:

receive a PUF mode operation to execute, first self-enrollment (SE), then key rebuilding (KR);

access to data representative of one-time programmable policy (P_OTP);

write and read data of a data RAM (D_RAM); and

write and read a one-time programmable data (D_OTP).

2 . The adaptive control system of a strong PUF source according to claim 1 , wherein the PUF control logic finite state machine (CFSM) is configured to:

access data RAM to make a repeated data collection of challenges/responses leveraging the data RAM (D_RAM) for accumulations;

if PUF mode operation received is self-enrollment (SE), select the most reliable challenges having a reliability greater than a reliability threshold, deliver a self-enrollment status (SE_S) taking the value good or bad depending on whether the self-enrollment went successfully or not, according to the corresponding reliability being greater than the reliability threshold and the corresponding entropy being greater than an entropy threshold, and write whitelisted challenges having a good self-enrollment status (SE_S) in the one-time programmable data (D_OTP); and

if PUF mode operation received is key rebuilding (KR), read the whitelisted challenges in the one-time programmable data (D_OTP), apply all whitelisted challenged, decide the key bits using adaptive control by querying the strong bit until the entropy and reliability thresholds are surpassed, deliver a key rebuilding status (KR_S) taking the value good or bad depending on whether the self-enrollment went successfully or not, and deliver a key (Key).

3 . The adaptive control system of a strong PUF source according to claim 2 , wherein the PUF control logic finite state machine (CFSM) is also configured to:

if PUF mode operation received is health tests (HT), estimate the reliability and the entropy of the at least one key, and deliver a health tests status (HT_S) taking the value good or bad depending on whether health tests are successful or not.

4 . The adaptive control system of a strong PUF source according claim 1 , wherein the one-time programmable data (D_OTP) contain:

a whitelist per PUF instance;

entropy and reliability thresholds; and

a life cycle for each PUF.

5 . The adaptive control system of a strong PUF source according to claim 2 , wherein the one-time programmable data (D_OTP) contain a life cycle for each PUF, including whether the PUF is enrolled.

6 . A method to deliver a self-enrollment status (SE_S), a key (K) and a key rebuilding status (KR_S), the method being implemented by an adaptive control system of a strong PUF source, the method comprising:

receiving information of entropy of at least one key, reliability of the at least one key and PUF index representative of one of the at least one key;

challenging and configure the strong PUF source (CSPS); and

receiving a quantized non-binary response in feedback of the strong PUF source (CSPS);

implemented in an adaptive PUF control unit (ACU), and the method comprising:

receiving a PUF mode operation to execute, first self-enrollment (SE), then key rebuilding (KR);

accessing to data representative of one-time programmable policy (P_OTP);

writing and reading data of a data RAM (D_RAM);

writing and reading a one-time programmable data (D_OTP);

implemented in a PUF control logic finite state machine (CFSM) configured to drive the adaptive control unit (ACU).

7 . A computer program product comprising instructions for carrying out the steps of the method of claim 6 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 3, 2024
From: GUILLEY, SYLVAIN; LOZAC'H, FLORENT
To: SECURE-IC SAS
Reel/Frame 068778/0444 →
Priority Claims (1)
EP 23190950 · Aug 10, 2023 · regional
Continuity (1)
Related Publication 20250055711A1 · Feb 13, 2025
References Cited (32)
US 8867739B2 · Danger · 2014 [cited by applicant]
US 10630492B2 · Guilley · 2020 [cited by examiner]
US 10855476B2 · Dafali et al. · 2020 [cited by applicant]
US 11005668B2 · Danger · 2021 [cited by examiner]
US 12052355B1 · Sehrawat · 2024 [cited by examiner]
US 20090083833A1 · Ziola · 2009 [cited by examiner]
US 20110055649A1 · Koushanfar · 2011 [cited by examiner]
US 20200210628A1 · Karpinskyy · 2020 [cited by examiner]
US 20230004681A1 · Suresh · 2023 [cited by examiner]
US 20240201256A1 · Noh · 2024 [cited by examiner]
US 20240372736A1 · Seidl · 2024 [cited by examiner]
US 20250005206A1 · Fang · 2025 [cited by examiner]
US 20250038999A1 · Wu · 2025 [cited by examiner]
CN 103020552A · 2013 [cited by applicant]
EP 3454319B1 · 2022 [cited by applicant]
“Information security, cybersecurity and privacy protection—Physically unclonable functions”, ISO/IEC 20897, First Edition, 2022. [cited by applicant]
Pour, et al., “PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community”, 2020 IEEE European Test Symposium (ETS), 2020. [cited by applicant]
Danger, et al., “PUFs: Standardization and Evaluation”, 2016 Mobile System Technologies Workshop (MST), pp. 12-18, 2016. [cited by applicant]
Extended European Search Report issued in European Patent Application No. EP 23190950.8, mailed Jan. 23, 2024. [cited by applicant]
Anik, et al., “Testing and reliability enhancement of security primitives: Methodology and experimental validation”, Microelectronics Reliability, vol. 147, Aug. 2023. [cited by applicant]
Maes, “Physically Unclonable Functions: Constructions, Properties and Applications”, PhD manuscript, Aug. 2012. [cited by applicant]
Shaub, et al., “The Big Picture of Delay-PUF Dependability”, ECCTD 2020, pp. 1-4, Sep. 2020. [cited by applicant]
“OTP-PUF—Tamperpoof storage” (Data protection from safeguarded anti-fuse OTP memory, Mar. 2024. https://www.pufsecurity.com/products/secure-otp/). [cited by applicant]
Ruhrmair, et al., “PUF Modeling Attacks on Simulated and Silicon Data”, IEEE Transactions on Information Forensics and Security, vol. 8, No. 11, Nov. 2013. [cited by applicant]
Jedec Standard, “Temperature, Bias, and Operating Life”, Jedec Standard, JEP122H, JESD22-A108G, Nov. 2022. [cited by applicant]
Lubicz, et al.,“Towards an Oscillator Based TRNG with a Certified Entropy Rate”, IEEE Trans. Computers, 64(4), 2014. [cited by applicant]
Rukhin et al., “A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications”, NIST, SP 800-22, section §4 of SP 800-22 Rev. 1a, Apr. 2010. [cited by applicant]
Schaub, et al., “An Improved Analysis of Reliability and Entropy for Delay PUFs”, 2018 21st Euromicro Conference on Digital System Design (DSD), 2018. [cited by applicant]
Jedec Publication, “Failure Mechanisms and Models for Semiconductor Devices”, JEP122H, Jedec Solid State Technology Association, 2016. [cited by applicant]
Ruhrmair, et al., “Modeling Attacks on Physical Unclonable Functions”, CCS '10: Proceedings of the 17th ACM conference on Computer and communications security, 2010. [cited by applicant]
Information obtained from a website. “VIA-PUF Security Chip for Root of Trust”, Design and Reuse, Jul. 4, 2022, [retrieved on Aug. 22, 2024]. Retrieved from the Internet: https://www.design-reuse.com/sip/via-puf-securit… [cited by applicant]
Jouini, et al., “An Easy-to-Design PUF based on a Single Oscillator: the Loop PUF”, 2012 15th Euromicro Conference on Digital System Design, 2012. [cited by applicant]