Granted Patent
B2
US 12,716,913 · App. 18/451,962 · Granted Aug 25, 2026
Low profile electronic testing system with flexible test PCB format
View Patent ↗
Loading inventors, assignments & file history…
Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded Apr 16, 2026
From: OLIVER, REAGAN
To: MODUS TEST, LLC
Reel/Frame 074386/0601 →
SECURITY INTEREST
Recorded Nov 17, 2025
From: MODUS TEST, LLC
To: ROGERS, BRUCE D
Reel/Frame 072926/0632 →
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded Sep 7, 2023
From: ADAMS, LYNWOOD; LEWIS, JACK; KELESHIAN, NJTEH
To: MODUS TEST, LLC
Reel/Frame 064831/0783 →
Continuity (2)
Provisional Application
63399866
· Aug 22, 2022
References Cited (42)
US 5436567A
· Wexler
· 1995
[cited by examiner]
US 6040691A
· Hanners
· 2000
[cited by examiner]
US 6350138B1
· Atobe
· 2002
[cited by examiner]
US 6396291B1
· Akram
· 2002
[cited by examiner]
US 9680471B2
· Stark
· 2017
[cited by applicant]
US 9885737B2
· Adams
· 2018
[cited by applicant]
US 20010050427A1
· Inomata
· 2001
[cited by examiner]
US 20130135002A1
· Grover
· 2013
[cited by applicant]
US 20210368803A1
· Swamy
· 2021
[cited by applicant]
US 20210368806A1
· Rifa
· 2021
[cited by applicant]