Granted Patent
Utility
US 4,360,964 · App. 06/240,444
Nondestructive testing of semiconductor materials
Inventors:
Randall K. Gilly, David L. Rehrig
Patented Case
View Patent ↗
Granted: Nov 30, 1982
Filed: Mar 4, 1981
Inventors
Randall K. Gilly
David L. Rehrig
Assignee (at issue)
Western Electric Company, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.