Granted Patent
Utility
US 4,418,403 · App. 06/275,057
Semiconductor memory cell margin test circuit
Inventors:
James E. O'Toole, Robert J. Proebsting
Patented Case
View Patent ↗
Granted: Nov 29, 1983
Filed: Feb 2, 1981
Inventors
James E. O'Toole
Robert J. Proebsting
Assignee (at issue)
Mostek Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.