Granted Patent
Utility
US 4,476,489 · App. 06/380,090
Microfinish measurement apparatus and technique
Inventors:
Gary P. Weltlich, Gary Wagner
Patented Case
View Patent ↗
Granted: Oct 9, 1984
Filed: May 20, 1982
Inventors
Gary P. Weltlich
Gary Wagner
Assignee (at issue)
INSPECTION TECH, LTD
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.