IP Library › Granted Patent US 4,564,807
Granted Patent Utility
US 4,564,807 · App. 06/593,801

Method of judging carrier lifetime in semiconductor devices

Inventors: Hiroyuki Ikezi, Richard L. Freeman
Patented Case View Patent ↗
Granted: Jan 14, 1986 Filed: Mar 27, 1984
Inventors
Hiroyuki Ikezi
Richard L. Freeman
Assignee (at issue)
GA Technologies, Inc.

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Quick Facts
Patent No.
US 4,564,807
App. No.
06/593,801
Filed
1984-03-27
Granted
1986-01-14
Kind
A