Granted Patent
Utility
US 4,605,894 · App. 06/527,214
High density test head
Inventors:
Gerald L. Cox, Bill DeHaven
Patented Case
View Patent ↗
Granted: Aug 12, 1986
Filed: Aug 29, 1983
Inventors
Gerald L. Cox
Bill DeHaven
Assignee (at issue)
GenRad Semiconductor Test, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.