Granted Patent
Utility
US 4,607,220 · App. 06/607,693
Method and apparatus for low temperature testing of electronic components
Inventor:
Kenneth F. Hollman
Patented Case
View Patent ↗
Granted: Aug 19, 1986
Filed: May 7, 1984
Inventor
Kenneth F. Hollman
Assignee (at issue)
The Micromanipulator Company, LLC
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.