Granted Patent
Utility
US 4,862,069 · App. 07/082,054
Method of in-circuit testing
Inventor:
Alan J. Albee
Patented Case
View Patent ↗
Granted: Aug 29, 1989
Filed: Aug 5, 1987
Inventor
Alan J. Albee
Assignee (at issue)
Genrad, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.