IP Library Granted Patent US 4,868,106
Granted Patent Utility
US 4,868,106 · App. 06/919,676

Analytical element and method for determining a component in a test sample

Inventors: Tsukasa Ito, Satoshi Kawakatsu, Akira Onishi, Masayo Ishikawa
Patented Case View Patent ↗
Granted: Sep 19, 1989 Filed: Oct 16, 1986
Inventors
Tsukasa Ito
Satoshi Kawakatsu
Akira Onishi
Masayo Ishikawa
Assignee (at issue)
Konishiroku Photo Industry Co., Ltd.

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Quick Facts
Patent No.
US 4,868,106
App. No.
06/919,676
Filed
1986-10-16
Granted
1989-09-19
Kind
A