Granted Patent
Utility
US 5,027,064 · App. 07/340,611
Method and means for measuring operating temperature of semiconductor devices by monitoring RF characteristics
Inventor:
Stephen C. Cripps
Patented Case
View Patent ↗
Granted: Jun 25, 1991
Filed: Apr 19, 1989
Inventor
Stephen C. Cripps
Assignee (at issue)
Celeritek
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.