Granted Patent
Utility
US 5,109,257 · App. 07/456,676
Testing circuit for semiconductor memory array
Inventor:
Ichiro Kondo
Patented Case
View Patent ↗
Granted: Apr 28, 1992
Filed: Dec 27, 1989
Inventor
Ichiro Kondo
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.