Granted Patent
Utility
US 5,111,261 · App. 07/564,814
Silicon thin film transistor with an intrinsic silicon active layer formed within the boundary defined by the edges of the gate electrode and the impurity containing silicon layer
Inventors:
Sakae Tanaka, Yoshiaki Watanabe, Katsuo Shirai, Yoshihisa Ogiwara
Patented Case
View Patent ↗
Granted: May 5, 1992
Filed: Aug 8, 1990
Inventors
Sakae Tanaka
Yoshiaki Watanabe
Katsuo Shirai
Yoshihisa Ogiwara
Assignees (at issue)
Seikosha Co., Ltd.
Nippon Precision Circuits Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.