IP Library › Granted Patent US 5,119,378
Granted Patent Utility
US 5,119,378 · App. 07/513,636

Testing of integrated circuits including internal test circuitry and using token passing to select testing ports

Inventors: Kenneth Brakeley Welles, II, Richard I. Hartley, Michael James Hartman, Paul Delano
Patented Case View Patent ↗
Granted: Jun 2, 1992 Filed: Apr 24, 1990
Inventors
Kenneth Brakeley Welles, II
Richard I. Hartley
Michael James Hartman
Paul Delano
Assignee (at issue)
General Electric Company

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Quick Facts
Patent No.
US 5,119,378
App. No.
07/513,636
Filed
1990-04-24
Granted
1992-06-02
Kind
A