IP Library Granted Patent US 5,172,377
Granted Patent Utility
US 5,172,377 · App. 07/578,960

Method for testing mixed scan and non-scan circuitry

Inventors: Gordon D. Robinson, John Deshayes
Patented Case View Patent ↗
Granted: Dec 15, 1992 Filed: Sep 7, 1990
Inventors
Gordon D. Robinson
John Deshayes
Assignee (at issue)
Genrad, Inc.

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Quick Facts
Patent No.
US 5,172,377
App. No.
07/578,960
Filed
1990-09-07
Granted
1992-12-15
Kind
A