Granted Patent
Utility
US 5,291,495 · App. 07/729,282
Method for designing a scan path for a logic circuit and testing of the same
Inventor:
Jon Udell
Patented Case
View Patent ↗
Granted: Mar 1, 1994
Filed: Jul 12, 1991
Inventor
Jon Udell
Assignee (at issue)
NCR Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.