IP Library › Granted Patent US 5,310,720
Granted Patent Utility
US 5,310,720 · App. 08/021,573

Process for fabricating an integrated circuit device by forming a planarized polysilazane layer and oxidizing to form oxide layer

Inventors: Daitei Shin, Hideki Harada
Patented Case View Patent ↗
Granted: May 10, 1994 Filed: Feb 24, 1993
Inventors
Daitei Shin
Hideki Harada
Assignees (at issue)
Fujitsu Limited
Kyushu Fujitsu Electronics Limited

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Quick Facts
Patent No.
US 5,310,720
App. No.
08/021,573
Filed
1993-02-24
Granted
1994-05-10
Kind
A