Granted Patent
Utility
US 5,321,363 · App. 08/001,851
Two-terminal circuit element measuring apparatus for performing contact checks
Inventors:
Hideki Wakamatsu, Nobuo Nakata, Yohichi Kuboyama, Hideshi Tanaka
Patented Case
View Patent ↗
Granted: Jun 14, 1994
Filed: Jan 8, 1993
Inventors
Hideki Wakamatsu
Nobuo Nakata
Yohichi Kuboyama
Hideshi Tanaka
Assignee (at issue)
Hewlett-Packard Company, L.P.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.