Granted Patent
Utility
US 5,363,049 · App. 08/008,167
Single device under test (DUT) port common reference/matching impedance cirtuit for the detection and location of DUT faults
Inventors:
Andrew Bullock, George Hjipieris
Patented Case
View Patent ↗
Granted: Nov 8, 1994
Filed: Jan 25, 1993
Inventors
Andrew Bullock
George Hjipieris
Assignee (at issue)
Marconi Instruments Limited
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.