Granted Patent
Utility
US 5,383,354 · App. 08/172,974
Process for measuring surface topography using atomic force microscopy
Inventors:
Bruce B. Doris, Rama I. Hegde
Patented Case
View Patent ↗
Granted: Jan 24, 1995
Filed: Dec 27, 1993
Inventors
Bruce B. Doris
Rama I. Hegde
Assignee (at issue)
Motorola, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.