Granted Patent
Utility
US 5,408,318 · App. 08/101,226
Wide range straightness measuring stem using a polarized multiplexed interferometer and centered shift measurement of beam polarization components
Inventor:
Dan Slater
Patented Case
View Patent ↗
Granted: Apr 18, 1995
Filed: Aug 2, 1993
Inventor
Dan Slater
Assignee (at issue)
NEARFIELD SYSTEMS INCORPORATED
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.