IP Library › Granted Patent US 5,447,053
Granted Patent Utility
US 5,447,053 · App. 08/150,142

Method and device for measuring quantities of impurities in special gas

Inventor: Tadahiro Ohmi
Patented Case View Patent ↗
Granted: Sep 5, 1995 Filed: Jan 31, 1994
Inventor
Tadahiro Ohmi

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Quick Facts
Patent No.
US 5,447,053
App. No.
08/150,142
Filed
1994-01-31
Granted
1995-09-05
Kind
A