Granted Patent
Utility
US 5,475,695 · App. 08/033,775
Automatic failure analysis system
Inventors:
John Caywood, Alan B. Helffrich, III, Yervant David Lepejian
Patented Case
View Patent ↗
Granted: Dec 12, 1995
Filed: Mar 19, 1993
Inventors
John Caywood
Alan B. Helffrich, III
Yervant David Lepejian
Assignee (at issue)
Semiconductor Diagnosis & Test Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.