Granted Patent
Utility
US 5,578,938 · App. 08/494,493
Semiconductor integrated circuit having a clock skew test circuit
Inventor:
Tetsuo Kazami
Patented Case
View Patent ↗
Granted: Nov 26, 1996
Filed: Jun 26, 1995
Inventor
Tetsuo Kazami
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.