Granted Patent
Utility
US 5,600,137 · App. 08/546,046
Probe apparatus having reduced misalignment of conductive needles
Inventors:
Mitsuchika Saito, You-Wen Yi
Patented Case
View Patent ↗
Granted: Feb 4, 1997
Filed: Oct 20, 1995
Inventors
Mitsuchika Saito
You-Wen Yi
Assignee (at issue)
Hewlett-Packard Company, L.P.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.