Granted Patent
Utility
US 5,610,866 · App. 08/331,699
Circuit structure and method for stress testing of bit lines
Inventor:
David C. McClure
Patented Case
View Patent ↗
Granted: Mar 11, 1997
Filed: Oct 31, 1994
Inventor
David C. McClure
Assignee (at issue)
STMICROELECTRONICS, INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.