Granted Patent
Utility
US 5,621,742 · App. 08/478,927
Method and apparatus for testing semiconductor integrated circuit devices
Inventor:
Kenji Yoshino
Patented Case
View Patent ↗
Granted: Apr 15, 1997
Filed: Jun 7, 1995
Inventor
Kenji Yoshino
Assignee (at issue)
Kawasaki Steel Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.