IP Library › Granted Patent US 5,627,842
Granted Patent Utility
US 5,627,842 · App. 08/658,011

Architecture for system-wide standardized intra-module and inter-module fault testing

Inventors: Joseph Harrington Matanane Brown, Dilip K. Bhavsar
Patented Case View Patent ↗
Granted: May 6, 1997 Filed: Jun 4, 1996
Inventors
Joseph Harrington Matanane Brown
Dilip K. Bhavsar
Assignee (at issue)
Digital Equipment Corporation

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Quick Facts
Patent No.
US 5,627,842
App. No.
08/658,011
Filed
1996-06-04
Granted
1997-05-06
Kind
A