IP Library › Granted Patent US 5,633,828
Granted Patent Utility
US 5,633,828 · App. 08/519,075

Circuitry and methodology to test single bit failures of integrated circuit memory devices

Inventors: David C. McClure, Mark A. Lysinger, Frank J. Sigmund, John A. Michlowsky
Patented Case View Patent ↗
Granted: May 27, 1997 Filed: Aug 24, 1995
Inventors
David C. McClure
Mark A. Lysinger
Frank J. Sigmund
John A. Michlowsky
Assignee (at issue)
STMICROELECTRONICS, INC.

This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.

Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 5,633,828
App. No.
08/519,075
Filed
1995-08-24
Granted
1997-05-27
Kind
A