Granted Patent
Utility
US 5,636,025 · App. 08/262,130
System for optically measuring the surface contour of a part using more fringe techniques
Inventors:
Leonard H. Bieman, Mark Michniewicz
Patented Case
View Patent ↗
Granted: Jun 3, 1997
Filed: Jun 17, 1994
Inventors
Leonard H. Bieman
Mark Michniewicz
Assignee (at issue)
Medar, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.