Granted Patent
Utility
US 5,661,407 · App. 08/531,752
Integrated circuit probe testing device and method
Inventor:
Yukio Shibata
Patented Case
View Patent ↗
Granted: Aug 26, 1997
Filed: Sep 21, 1995
Inventor
Yukio Shibata
Assignee (at issue)
Kawasaki Steel Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.