Granted Patent
Utility
US 5,663,651 · App. 08/541,160
Method of separately determining plug resistor and interfacial resistor and test pattern for the same
Inventor:
Hiromitsu Hada
Patented Case
View Patent ↗
Granted: Sep 2, 1997
Filed: Oct 11, 1995
Inventor
Hiromitsu Hada
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.